DocumentCode :
3517375
Title :
Indoor-outdoor measurement inter-comparison of c-Si concentrating photovoltaic cells at 1X to 300X
Author :
Pravettoni, Mauro ; Fucci, Raffaele ; Norton, Matthew ; Paraskeva, Vasiliki ; Privato, Carlo ; Virtuani, Alessandro
Author_Institution :
Inst. of Appl. Sustainability to the Built Environ., Univ. of Appl. Sci. & Arts of Southern Switzerland, Canobbio, Switzerland
fYear :
2012
fDate :
3-8 June 2012
Abstract :
In this work the authors show results of a measurement inter-comparison campaign that saw the cooperation of the University of Applied Sciences and Arts of Southern Switzerland (SUPSI-ISAAC, indoor characterization), the Italian National Agency for New Technologies, Energy and Sustainable Economic Development (ENEA, outdoor characterization) and the University of Cyprus (indoor and outdoor characterization). The measurement campaign is extremely useful to improve the know-how of the centres involved. Aside the well-known spectral mismatch effects, the importance of the “capacitive effect” is highlighted in this work, which arises when the tested high-efficiency CPV cell are characterized indoor on a pulsed solar simulator, depending on the duration of the pulse.
Keywords :
elemental semiconductors; photovoltaic cells; silicon; solar cells; ENEA; Italian National Agency for New Technologies, Energy and Sustainable Economic Development; SUPSI-ISAAC; Si; University of Applied Sciences and Arts of Southern Switzerland; University of Cyprus; a measurement inter-comparison campaign; indoor characterization; indoor-outdoor measurement inter-comparison; outdoor characterization; photovoltaic cells; pulsed solar simulator; Abstracts; Area measurement; Capacitance; Current measurement; Educational institutions; Instruments; Optical variables measurement; capacitance; current-voltage characteristics; instrumentation and measurements; photovoltaic cells; silicon devices; standards development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6317841
Filename :
6317841
Link To Document :
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