DocumentCode
3517448
Title
The device on continuity covering test under high voltage for enamelled wires
Author
Qiuguang, Wang ; Dianchuen, Zheng ; Bin, Liu
Author_Institution
Harbin Univ. of Sci. & Technol., China
Volume
2
fYear
1997
fDate
25 -30 May 1997
Firstpage
1110
Abstract
The paper described a design of the device on continuity covering test under high voltage for enamelled wires, discussed its circuit principle and design method of program. The specifications of the device meet the standard GB4074.20-91, so it gives a new means to practice continuity covering test under high voltage for enamelled wires method in our country
Keywords
high-voltage techniques; insulated wires; insulation testing; GB4074.20-91 standard; circuit; continuity covering test; enamelled wire; high voltage device; program; Circuit testing; Copper; Hardware; IEC standards; Light emitting diodes; Microcomputers; Paper technology; Pulleys; Voltage; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location
Seoul
Print_ISBN
0-7803-2651-2
Type
conf
DOI
10.1109/ICPADM.1997.616642
Filename
616642
Link To Document