DocumentCode :
3517961
Title :
A 1.8 V 2.5 GHz PLL using 0.18 /spl mu/m SOI/CMOS technology
Author :
Yoshimura, K. ; Ueda, K. ; Nakura, T. ; Kubo, K. ; Mashiko, K. ; Maeda, S. ; Maegawa, S. ; Yamaguchi, Y. ; Matsuda, Y.
Author_Institution :
Syst. LSI Dev. Center, Mitsubishi Electr. Corp., Itami, Japan
fYear :
1999
fDate :
4-7 Oct. 1999
Firstpage :
12
Lastpage :
13
Abstract :
Summary form only given. This paper shows a 2.5 GHz PLL circuit for high-speed communication devices using a 0.18 /spl mu/m SOI/CMOS technology. The technology uses a shallow trench structure to effectively isolate active devices on a thin film SOI substrate. We employed floating-body SOI/CMOS in this chip. We applied a ring oscillator for the voltage controlled-oscillator (VCO). The well-known issues of SOI do not affect the circuit stability and noise performance of our PLL circuit for several reasons. Firstly, as the frequency range required for the VCO is comparatively narrow, the floating-body configuration would have little effect on circuit operation (Ueda et al., 1996). Secondly, thermal equilibrium on the ring oscillator can be achieved within a few microseconds (Tenbroek et al., 1998). Then the self-heating issue would be insignificant for the lock-in process of the PLL. Besides this, the buried oxide of SOI and shallow trench isolation reduces the crosstalk noise from the large digital logic block which is the most potentially serious problem for system-level integration of sensitive circuits and large logic blocks.
Keywords :
CMOS integrated circuits; MMIC oscillators; circuit stability; field effect MMIC; integrated circuit noise; isolation technology; phase locked loops; silicon-on-insulator; telecommunication equipment; voltage-controlled oscillators; 0.18 micron; 1.8 V; 2.5 GHz; PLL; PLL circuit; PLL lock-in process; SOI/CMOS technology; Si-SiO/sub 2/; VCO; VCO frequency range; active devices; buried oxide; circuit operation; circuit stability; crosstalk noise; digital logic block; floating-body SOI/CMOS chip; floating-body configuration; high-speed communication devices; logic blocks; noise performance; ring oscillator; self-heating; sensitive circuits; shallow trench isolation; shallow trench isolation structure; system-level integration; thermal equilibrium; thin film SOI substrate; voltage controlled-oscillator; CMOS technology; Crosstalk; Isolation technology; Logic circuits; Phase locked loops; Ring oscillators; Substrates; Thin film circuits; Thin film devices; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1999. Proceedings. 1999 IEEE International
Conference_Location :
Rohnert Park, CA, USA
ISSN :
1078-621X
Print_ISBN :
0-7803-5456-7
Type :
conf
DOI :
10.1109/SOI.1999.819834
Filename :
819834
Link To Document :
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