DocumentCode :
3517963
Title :
Modelling uncertainty in transcriptome measurements enhances network component analysis of yeast metabolic cycle
Author :
Chang, C.Q. ; Hung, Y.S. ; Niranjan, M.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong
fYear :
2009
fDate :
19-24 April 2009
Firstpage :
1769
Lastpage :
1772
Abstract :
Using high throughput DNA binding data for transcription factors and DNA microarray time course data, we constructed four transcription regulatory networks and analysed them using a novel extension to the network component analysis (NCA) approach. We incorporated probe level uncertainties in gene expression measurements into the NCA analysis by the application of probabilistic principal component analysis (PPCA), and applied the method to data from yeast metabolic cycle. Analysis shows statistically significant enhancement to periodicity in a large fraction of the transcription factor activities inferred from the model. For several of these we found literature evidence of post-transcriptional regulation. Accounting for probe level uncertainty of microarray measurements leads to improved network component analysis. Transcription factor profiles showing greater periodicity at their activity levels, rather than at the corresponding mRNA levels, for over half the regulators in the networks points to extensive post-transcriptional regulations.
Keywords :
DNA; lab-on-a-chip; principal component analysis; DNA microarray time course data; high throughput DNA binding; network component analysis; probabilistic principal component analysis; transcription factors; transcription regulatory networks; transcriptome measurements; yeast metabolic cycle; DNA; Data engineering; Fungi; Gene expression; Intelligent networks; Measurement uncertainty; Noise measurement; Probes; Regulators; Time measurement; Microarray; Network component analysis; Transcription regulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics, Speech and Signal Processing, 2009. ICASSP 2009. IEEE International Conference on
Conference_Location :
Taipei
ISSN :
1520-6149
Print_ISBN :
978-1-4244-2353-8
Electronic_ISBN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.2009.4959947
Filename :
4959947
Link To Document :
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