DocumentCode
3517982
Title
Influence of megasonic agitation on the electrodeposition of high aspect ratio blind vias
Author
Kaufmann, Jens ; Desmulliez, Marc P Y ; Price, Dennis ; Hughes, Mike ; Strussevich, Nadia ; Bailey, Chris
Author_Institution
Sch. of Eng. & Phys. Sci., Heriot-Watt Univ., Edinburgh
fYear
2008
fDate
1-4 Sept. 2008
Firstpage
1235
Lastpage
1240
Abstract
This paper presents preliminary studies in electroplating using megasonic agitation to avoid the formation of voids within high aspect ratio microvias that are used for the redistribution of interconnects in high density interconnection technology in printed circuit boards. Through this technique, uniform deposition of metal on the side walls of the vias is possible. High frequency acoustic streaming at megasonic frequencies enables the decrease of the Nernst diffusion layer down to the sub-micron range, allowing thereby conformal electrodeposition in deep grooves. This effect enables the normally convection free liquid near the surface to be agitated. Higher throughput and better control of the material properties of the deposits can be achieved for the manufacturing of embedded interconnections and metal-based MEMS. For optimal filling performance of the microvias, a full design of experiments (DOE) and a multi-physics numerical simulation have been conducted to analyse the influence of megasonic agitation on the plating quality of the microvias. Megasonic based deposition has been found to increase the deposition rate as well as improving the quality of the metal deposits.
Keywords
convection; design of experiments; electrodeposits; electroplating; integrated circuit interconnections; integrated circuit metallisation; printed circuits; convection free liquid; deposition rate; design of experiments; electrodeposition; electroplating; high aspect ratio blind vias; high density interconnection technology; megasonic agitation; metal deposits; multiphysics numerical simulation; printed circuit boards; Filling; Frequency; Integrated circuit interconnections; Manufacturing; Material properties; Micromechanical devices; Numerical simulation; Printed circuits; Throughput; US Department of Energy;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
Conference_Location
Greenwich
Print_ISBN
978-1-4244-2813-7
Electronic_ISBN
978-1-4244-2814-4
Type
conf
DOI
10.1109/ESTC.2008.4684530
Filename
4684530
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