The interface between different types of thick film layers

Author

Pelikánová, Ivana Beshajová

Author_Institution

Dept. of Electrotechnol., CTU in Prague, Prague, Czech Republic

fYear

2010

fDate

12-16 May 2010

Firstpage

61

Lastpage

64

Abstract

The investigation of conductive and resistive layers interface is topic of the work. Layers of measured structure were deposited by screen-printing of polymer pastes. The measured structure consists of contact area with different geometry. Contact resistance of interface between conductive and resistive layers was measured as a parameter of quality. The three-wire method was used for measurement. Experimental results were analyzed in the context of contacts geometry and frequency of powered signal.

Keywords

contact resistance; interface structure; polymers; printed circuits; thick film circuits; conductive layer interface; contact area; contact geometry; contact resistance; polymer pastes; printed circuit board; resistive layer interface; screen printing; thick film layer; three-wire method; Area measurement; Contact resistance; Current measurement; Electrical resistance measurement; Resistance; Thick films; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Technology (ISSE), 2010 33rd International Spring Seminar on

Conference_Location

Warsaw

Print_ISBN

978-1-4244-7849-1

Electronic_ISBN

978-1-4244-7850-7

Type

conf

DOI

10.1109/ISSE.2010.5547257

Filename

5547257