• DocumentCode
    3518100
  • Title

    A New Compact SRAM Cell by Vertical MOSFET for Low-Power and Stable Operation

  • Author

    Na, Hyoungjun ; Endoh, Tetsuo

  • Author_Institution
    Center for Interdiscipl. Res., Tohoku Univ., Sendai, Japan
  • fYear
    2011
  • fDate
    22-25 May 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a compact SRAM cell with low-power and stable operation is proposed using vertical MOSFET technology, and its impact on the cell size and the performance is examined. Although the proposed SRAM cell is composed of 12 transistors, it has a small cell size, which is only 74% of the conventional 8T-SRAM cell, because of its stacked vertical MOSFET structure. The proposed SRAM cell with vertical MOSFET realizes a reduced power dissipation during the write operation which is 47% and 44% of the conventional 6T and 8T SRAM cell, respectively. Furthermore, the proposed SRAM cell with vertical MOSFET has achieved 3 times larger write and read Static Noise Margin (SNM) than that of the conventional planar 6T or 8T-SRAM cell, and its SNM is more tolerant against threshold voltage (Vth) fluctuation.
  • Keywords
    MOSFET; SRAM chips; low-power electronics; SNM; Vth fluctuation; compact SRAM Cell; low-power operation; stable operation; static noise margin; threshold voltage fluctuation; vertical MOSFET technology; Computer architecture; Fluctuations; MOSFET circuits; Microprocessors; Power dissipation; Power supplies; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Workshop (IMW), 2011 3rd IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4577-0225-9
  • Electronic_ISBN
    978-1-4577-0224-2
  • Type

    conf

  • DOI
    10.1109/IMW.2011.5873204
  • Filename
    5873204