DocumentCode :
3518536
Title :
Characterization of the thermal impedance of high–power LED assembly based on innovative printed circuit board technology
Author :
Weilguni, Michael ; Nicolics, Johann ; Medek, Robert ; Franz, Manuela ; Langer, Gregor ; Lutschounig, Ferdinand
Author_Institution :
Inst. of Sensor & Actuator Syst., Vienna Univ. of Technol., Vienna, Austria
fYear :
2010
fDate :
12-16 May 2010
Firstpage :
238
Lastpage :
244
Abstract :
We present a method of dynamic thermal characterization of an entire test assembly, consisting of high-power Light Emitting Diodes (LED) and a printed circuit board (PCB) by measuring the thermal response on a power-on-step function and describing the thermal impedance with a Foster RC network. For this purpose, we record temporal temperature functions on test assemblies during pulse load experiments under defined initial and boundary conditions (the assemblies were horizontally positioned under free air in a test chamber), establish the LEDs´ junction temperature-versus-time functions for known power functions and calibrate the parameters of the Foster RC network. Moreover, we reveal connections between design parameters (conductor layout, thermal via geometry, and PCB material) and the thermal impedance of the assembly. The method allows the user to predict the LED´s junction temperature as transient thermal response on an arbitrary pulse load function (as e.g. flashes with different intensity, duration and repetition rate) with low effort.
Keywords :
assembling; light emitting diodes; printed circuits; thermal analysis; transient response; Foster RC network; LED junction temperature; LED time function; arbitrary pulse load function; dynamic thermal characterization; high-power LED assembly; high-power light emitting diodes; innovative printed circuit board technology; power-on-step function; temporal temperature functions; test assembly; thermal impedance; transient thermal response; Assembly; Junctions; Layout; Light emitting diodes; Temperature measurement; Thermal loading; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology (ISSE), 2010 33rd International Spring Seminar on
Conference_Location :
Warsaw
Print_ISBN :
978-1-4244-7849-1
Electronic_ISBN :
978-1-4244-7850-7
Type :
conf
DOI :
10.1109/ISSE.2010.5547295
Filename :
5547295
Link To Document :
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