Computer simulations and performance measurements on a silicon strip detector for edge-on imaging

Author

Lundqvist, M. ; Cederstrom, B. ; Chmill, V. ; Danielsson, M. ; Nygren, D.

Author_Institution

Dept. of Phys., R. Inst. of Technol., Stockholm, Sweden

Volume

1

fYear

1999

fDate

1999

Firstpage

433

Abstract

Silicon strip detectors to be used edge-on for imaging in a scanned slit geometry have been simulated. A software program was developed which can simulate the motion of free charges in the bulk detector and calculate the signals they induce on the electrodes. The purpose was to quantify the impact of charge sharing on system detective quantum efficiency (DQE). The energy spectrum that was used in this study is typical for mammography. The detectors are working in single photon counting mode and the optimal threshold level to discriminate noise from useful signals has been calculated. The loss in detective quantum efficiency due to charge sharing was found to be around 5% for a 100 μm pitch detector. Coincidence circuits can be included in the electronics to eliminate this problem. Furthermore, it is described how the relationship between charge collection efficiency and photon interaction position in the detector can be measured

Keywords

diagnostic radiography; digital simulation; mammography; silicon radiation detectors; 100 micron; Si; Si strip detector; charge collection efficiency; charge sharing; coincidence circuits; computer simulation; detective quantum efficiency; edge-on imaging; mammography; photon interaction position; scanned slit geometry; single photon counting; Computational modeling; Computer simulation; Detectors; Geometry; Image edge detection; Measurement; Motion detection; Silicon; Solid modeling; Strips;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE

Conference_Location

Seattle, WA

ISSN

1082-3654

Print_ISBN

0-7803-5696-9

Type

conf

DOI

10.1109/NSSMIC.1999.842522

Filename

842522