Title :
Growth of metamorphic GaAsP solar cells on GaP
Author :
Tomasulo, Stephanie ; Yaung, Kevin Nay ; Simon, John ; Lee, Minjoo Larry
Author_Institution :
Yale Univ., New Haven, CT, USA
Abstract :
In this work, we demonstrate metamorphic GaAsxP1-x/GaP solar cells grown by molecular beam epitaxy for potential dual-junction integration with Si. We investigate the appropriate substrate orientation and growth conditions necessary to obtain smooth surface morphology with high open-circuit voltage (Voc). Growing nearly identical GaAsxP1-x/GaP (x=0.65±0.01) cells at three different substrate temperatures allowed us to investigate the dislocation dynamics in the graded buffer, revealing that we are not in the ideal glide-limited regime. We expect this is due to thread interactions with morphological defects. To satisfy the design requirements of the ideal dual-junction device, we grew 1.71 eV GaAs0.73P0.27/GaP cells, attaining a high Voc of 1.15 V. With increased short-circuit current through the addition of a window layer and antireflection coating, the GaAsxP1-x cells presented here cascaded with Si could reach efficiencies as high as 30%.
Keywords :
III-V semiconductors; antireflection coatings; gallium arsenide; molecular beam epitaxial growth; solar cells; GaAsxP1-x-GaP; antireflection coating; dislocation dynamics; electron volt energy 1.71 eV; metamorphic solar cells; molecular beam epitaxy; open-circuit voltage; short-circuit current; surface morphology; voltage 1.15 V; window layer; Molecular beam epitaxial growth; Morphology; Photovoltaic cells; Rough surfaces; Silicon; Substrates; Surface morphology; GaAsP; dual-junction photovoltaic cells; molecular beam epitaxy;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0064-3
DOI :
10.1109/PVSC.2012.6317921