DocumentCode
3519155
Title
The effects of bonding parameters on the reliability performance of flexible RFID tag inlays packaged by anisotropic conductive adhesive
Author
Cai, Xiong-Hui ; Chen, Xian-Cai ; An, Bing ; Wu, Feng-Shun ; Wu, Yi-Ping
Author_Institution
Coll. of Mater. Sci. & Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear
2009
fDate
10-13 Aug. 2009
Firstpage
1054
Lastpage
1058
Abstract
In this work, ACA was prepared by mixing micro-sized spherical Ag particles into thermo-set epoxy resin, and RFID flip chips were assembled on the Al/PET antennae through hot-press process. The effect of bonding parameters, such as the curing degree, the curing rate and the temperature combination of down and up hot-press heads on the contact resistance and shear strength of ACA bonding joints for flexible RFID application were studied. And the reliability test (high-temperature and humidity test, 85degC, 85% relative humidity, 288 hrs) was also used to investigate the reliability of RFID tag inlays. It was found that these bonding parameters had great effect on the mechanical and electrical performance of bonding joints. For this ACA prepared here, the optimum bonding parameters for flexible RFID tag inlays was that: the curing degree is 85%, the curing rate is 15s / 170degC, and the temperature of down and up hot-press heads are 180degC/160degC.
Keywords
bonding processes; conductive adhesives; flip-chip devices; integrated circuit reliability; polymers; radiofrequency identification; silver; Ag; RFID flip chips; anisotropic conductive adhesive; bonding joints; bonding parameters; contact resistance; curing degree; flexible RFID tag inlays; microsized spherical silver particles; reliability test; shear strength; thermo-set epoxy resin; Anisotropic magnetoresistance; Bonding; Conductive adhesives; Curing; Humidity; Packaging; RFID tags; Radiofrequency identification; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-4658-2
Electronic_ISBN
978-1-4244-4659-9
Type
conf
DOI
10.1109/ICEPT.2009.5270585
Filename
5270585
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