DocumentCode :
3519175
Title :
High Resolution Optical Phase Response Measurement Using Single Sideband Modulation
Author :
Adams, D.B. ; Madsen, C.K.
Author_Institution :
Texas A&M Univ., College Station, TX, USA
fYear :
2008
fDate :
24-28 Feb. 2008
Firstpage :
1
Lastpage :
3
Abstract :
A high-resolution measurement to characterize the optical amplitude and phase is presented that uses single sideband modulation, a swept-wavelength tunable laser, and a Mach-Zehnder interferometer for frequency offset accuracy.
Keywords :
Mach-Zehnder interferometers; laser tuning; optical modulation; Mach-Zehnder interferometer; frequency offset accuracy; optical phase response measurement; single sideband modulation; swept-wavelength tunable laser; Frequency; High speed optical techniques; Optical filters; Optical interferometry; Optical mixing; Optical modulation; Optical resonators; Optical sensors; Phase measurement; Phase modulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Fiber communication/National Fiber Optic Engineers Conference, 2008. OFC/NFOEC 2008. Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-55752-856-8
Type :
conf
DOI :
10.1109/OFC.2008.4528050
Filename :
4528050
Link To Document :
بازگشت