• DocumentCode
    3519251
  • Title

    Evaluating vapor phase soldering for fine pitch BGA

  • Author

    Geczy, Attila ; Batorfi, Reka ; Gal, Laszlo ; Illyefalvi-Vitez, Zsolt ; Szoke, Peter

  • Author_Institution
    Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Budapest, Hungary
  • fYear
    2010
  • fDate
    12-16 May 2010
  • Firstpage
    482
  • Lastpage
    487
  • Abstract
    Surface mounted components are considered fine pitch if lead pitches are equal or lower than 0.65 mm (25 mils). Fine pitch Ball Grid Array (BGA) Integrated Circuits (IC-s) require special considerations for design, assembly and failure analysis. Design for Manufacturing (DfM) is a key aspect in the PCB design process. As for soldering, Vapor Phase Soldering (VPS) is an emerging reflow method for fine pitch surface mounted components. Thermal profiling investigation is also important during the process of VPS. The Department of Electronics Technology of BME has been carrying out research and prototyping with the use of an Asscon Quicky 450 type Vapor Phase Soldering system and a locally developed experimental VPS system. The application of two systems makes it possible to use parallel experiments with two different Galden liquids with distinct boiling points. The experimental VPS system is very flexible considering heat profiling and temperature control. In this paper an experiment is presented, where a custom set of test boards and 0.65 mm pitch BGA were used and a set of thermal profiles were measured to evaluate VPS reflow soldering for fine pitch surface mounted components.
  • Keywords
    ball grid arrays; design for manufacture; failure analysis; integrated circuit packaging; printed circuit design; reflow soldering; surface mount technology; thermal analysis; Asscon Quicky 450; Galden liquids; PCB design process; VPS reflow soldering evaluation; design for manufacturing; experimental VPS system; failure analysis; fine pitch BGA; fine pitch ball grid array integrated circuits; fine pitch surface mounted components; size 0.65 mm; surface mounted components; temperature control; test boards; thermal profiling; vapor phase soldering system evaluation; Heating; Soldering; Springs; Surface treatment; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology (ISSE), 2010 33rd International Spring Seminar on
  • Conference_Location
    Warsaw
  • Print_ISBN
    978-1-4244-7849-1
  • Electronic_ISBN
    978-1-4244-7850-7
  • Type

    conf

  • DOI
    10.1109/ISSE.2010.5547343
  • Filename
    5547343