DocumentCode :
3519324
Title :
Reliability study of low cost alternative Ag bonding wire with various bond pad materials
Author :
Yoo, Kyung-Ah ; Uhm, Chul ; Kwon, Tae-Jin ; Cho, Jong-Soo ; Moon, Jeong-Tak
Author_Institution :
MK Electron Co., Ltd., Yongin, South Korea
fYear :
2009
fDate :
9-11 Dec. 2009
Firstpage :
851
Lastpage :
857
Abstract :
There have been many studies on replacing Au bonding wire with other bonding wire materials, because the cost of Au has dramatically increased by approximately 2~3 times in recent years. When replacing part of the bond pad with a noble metal, Ag bonding wire is of particular interest due to its superior electrical properties, lower cost and similar mechanical properties as compared with Au. Ag bonding wire is thermosonically bonded to 3 kinds of bond pad (Al, Au and Pd) and aged at high temperature (175°C). Then, the bondability and interface reactions are characterized at each bond pad. In the case of Ag-Al bonding, 2 kinds of intermediate phases were observed and the composition ratios of Ag and Al in these phases were 4:1 and 2:1, respectively. After 300 hrs of aging, cracks were formed in these intermediate phases and ball-lift failure occurred. However, in the case of the noble metal bond pad, a solid solution was formed between the Ag wire and bond pad and no voids or cracks were formed. This shows the robust bonding characteristics. The diffusion layer was observed and the diffraction pattern was analyzed by TEM (Transmission Electron microscopy). The Au-Al bond reliability was also characterized by a comparative study. In this study, Ag bonding wire is proposed as an alternative to Au bonding wire for noble metal pads. Also, the thermal reliability is reviewed and the failure mechanisms are verified with various bond pads.
Keywords :
ageing; bonding processes; cracks; diffusion; failure analysis; gold; integrated circuit interconnections; reliability; silver; transmission electron microscopy; Ag-Al; Ag-Au; Ag-Pd; Au-Al bond reliability; ageing; ball-lift failure; bond pad materials; cracks; diffraction pattern; diffusion layer; failure mechanisms; gold bonding wire; interconnect IC chips; interface reactions; low cost alternative silver bonding wire; noble metal pads; solid solution; temperature 175 degC; thermal reliability; transmission electron microscopy; Aging; Bonding; Costs; Gold; Materials reliability; Mechanical factors; Robustness; Solids; Temperature; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5099-2
Electronic_ISBN :
978-1-4244-5100-5
Type :
conf
DOI :
10.1109/EPTC.2009.5416424
Filename :
5416424
Link To Document :
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