DocumentCode
3519370
Title
Board level reliability assessments of thru-mold via package on package (TMV™ PoP)
Author
Tae-Kyung Hwang ; Dong-Joo Park ; Jin-Seong Kim ; Jae-Dong Kim ; Choon-Heung Lee
Author_Institution
Amkor Technol. Korea, Inc., Seoul, South Korea
fYear
2009
fDate
10-13 Aug. 2009
Firstpage
1124
Lastpage
1129
Abstract
In recent years, package-on-package (PoP) has been adopted as major application package platform in 3D integration of logic and memory devices. However, as electronic technology developed, higher technology requirements are requested in packaging. Amkor Technology, Inc introduced the next generation PoP solution to meet the next generation technology requirements in 2008 by the using of TMVtrade technology which incorporates a laser ablation process that is conducive to current matrix-molded semiconductor assembly techniques. The next generation PoP platform named as TMVtrade PoP has been qualified in all package level qualification tests. Also in board level reliability tests, BLR TC & drop performances are similar or better than those of the conventional PoP.
Keywords
integrated circuit packaging; integrated circuit reliability; logic devices; moulding; 3D integration; Amkor Technology, Inc; BLR TC & drop performances; TMV PoP; board level reliability; electronic technology; logic devices; matrix-molded semiconductor assembly; memory devices; package on package; thru-mold via; Bonding; Chip scale packaging; Electronics packaging; Laser ablation; Logic devices; Memory architecture; Semiconductor device packaging; Signal processing; Stacking; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-4658-2
Electronic_ISBN
978-1-4244-4659-9
Type
conf
DOI
10.1109/ICEPT.2009.5270597
Filename
5270597
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