• DocumentCode
    3519469
  • Title

    Ball impact response based on modeling techniques

  • Author

    Shinohara, Kazunori ; Yu, Qiang ; Fujita, Masato ; Ishii, Hideaki ; Ishikawa, Hisao

  • Author_Institution
    Kanagawa Acad. of Sci. & Technol., Kawasaki, Japan
  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    828
  • Lastpage
    833
  • Abstract
    This paper focuses on the study of the drop-impact reliability of solder joints of integrated circuit components on printed circuit boards. The impact strength and impact toughness of solder alloys are investigated by performing the ball impact test (an experimental approach). For comparison with experimental results, the fracture of a single solder joint specimen is numerically simulated using the finite element method. The fatigue strength of solder joints depends strongly on the structure of the intermetallic compound formed between solder balls and copper pads. The stiffness of all interfaces reduces due to the local stress concentration. This stress concentration occurs because of the formation of the structure between the solder ball and the substrate. The reliability of a product depends on the interface between the solder ball and the substrate.
  • Keywords
    fatigue; finite element analysis; fracture toughness; impact strength; integrated circuit reliability; printed circuits; solders; Cu; ball impact response; copper pads; drop impact reliability; fatigue strength; finite element method; impact strength; impact toughness; integrated circuit components; intermetallic compound; printed circuit boards; solder alloys; solder joints; Circuit simulation; Circuit testing; Fatigue; Finite element methods; Integrated circuit reliability; Numerical simulation; Performance evaluation; Printed circuits; Soldering; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-5099-2
  • Electronic_ISBN
    978-1-4244-5100-5
  • Type

    conf

  • DOI
    10.1109/EPTC.2009.5416434
  • Filename
    5416434