DocumentCode
3519469
Title
Ball impact response based on modeling techniques
Author
Shinohara, Kazunori ; Yu, Qiang ; Fujita, Masato ; Ishii, Hideaki ; Ishikawa, Hisao
Author_Institution
Kanagawa Acad. of Sci. & Technol., Kawasaki, Japan
fYear
2009
fDate
9-11 Dec. 2009
Firstpage
828
Lastpage
833
Abstract
This paper focuses on the study of the drop-impact reliability of solder joints of integrated circuit components on printed circuit boards. The impact strength and impact toughness of solder alloys are investigated by performing the ball impact test (an experimental approach). For comparison with experimental results, the fracture of a single solder joint specimen is numerically simulated using the finite element method. The fatigue strength of solder joints depends strongly on the structure of the intermetallic compound formed between solder balls and copper pads. The stiffness of all interfaces reduces due to the local stress concentration. This stress concentration occurs because of the formation of the structure between the solder ball and the substrate. The reliability of a product depends on the interface between the solder ball and the substrate.
Keywords
fatigue; finite element analysis; fracture toughness; impact strength; integrated circuit reliability; printed circuits; solders; Cu; ball impact response; copper pads; drop impact reliability; fatigue strength; finite element method; impact strength; impact toughness; integrated circuit components; intermetallic compound; printed circuit boards; solder alloys; solder joints; Circuit simulation; Circuit testing; Fatigue; Finite element methods; Integrated circuit reliability; Numerical simulation; Performance evaluation; Printed circuits; Soldering; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location
Singapore
Print_ISBN
978-1-4244-5099-2
Electronic_ISBN
978-1-4244-5100-5
Type
conf
DOI
10.1109/EPTC.2009.5416434
Filename
5416434
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