• DocumentCode
    3519790
  • Title

    Damage mechanics of solder/IMC interface fracture in Pb-free solder interconnects

  • Author

    Bo, Lai Zheng ; Keat, Loh Wei ; Tamin, AMohd Nasir

  • Author_Institution
    Comput. Solid Mech. Lab. (CSMLab), Univ. Teknol. Malaysia, Skudai, Malaysia
  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    731
  • Lastpage
    736
  • Abstract
    This study addresses the mechanics of the relatively brittle solder/intermetallic (IMC) interface fracture process using damage mechanics concept. The damage state, ¿ of a material point in the solder/IMC interface, is expressed in terms of orthogonal traction components in a quadratic failure criterion of a cohesive zone model. The model is then employed in a finite element analysis of a solder ball shear push test. The simulated test specimen consists of reflowed SAC405 solder-on-OSP copper pad and orthotropic FR4 substrate. Unified inelastic strain constitutive model with optimized material parameters describes the strain rate-response of the SAC405 solder. The cohesive zone model parameter values are compiled from published experimental data on SAC405 solder ball pull tests and shear push tests. The predicted shear tool force-displacement curve compared well with published experimental data. The normal-to-shear traction ratio at the onset of interface fracture is 1.59 indicating significant induced bending effect due to shear tool clearance. Rapid interface crack propagation is predicted following the initiation of crack with the average crack speed up to 24.6 times the applied shear tool speed at 3000 mm/sec. The progressive boundary between damaged (¿<1.0) and fractured (¿=1.0) interface is interpreted as the interface crack front. The high stress concentration along the edge of the solder/IMC interface facilitates local crack initiation and dictates the shape of the dynamic crack front.
  • Keywords
    cracks; failure analysis; finite element analysis; fracture mechanics; integrated circuit interconnections; materials testing; solders; Pb-free solder interconnects; ball pull tests; cohesive zone model parameter values; damage mechanics; damage state; dynamic crack front; finite element analysis; high stress concentration; induced bending effect; interface crack front; local crack initiation; material point; normal-to-shear traction ratio; optimized material parameters; orthogonal traction components; orthotropic FR4 substrate; quadratic failure criterion; rapid interface crack propagation; reflowed SAC405 solder-on-OSP copper pad; relatively brittle solder/intermetallic interface fracture process; shear push tests; shear tool clearance; shear tool force-displacement curve; solder ball shear push test; solder/IMC interface; strain rate-response; unified inelastic strain constitutive model; Capacitive sensors; Equations; Lead; Packaging; Plastics; Predictive models; Soldering; Solid modeling; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-5099-2
  • Electronic_ISBN
    978-1-4244-5100-5
  • Type

    conf

  • DOI
    10.1109/EPTC.2009.5416455
  • Filename
    5416455