DocumentCode :
3519790
Title :
Damage mechanics of solder/IMC interface fracture in Pb-free solder interconnects
Author :
Bo, Lai Zheng ; Keat, Loh Wei ; Tamin, AMohd Nasir
Author_Institution :
Comput. Solid Mech. Lab. (CSMLab), Univ. Teknol. Malaysia, Skudai, Malaysia
fYear :
2009
fDate :
9-11 Dec. 2009
Firstpage :
731
Lastpage :
736
Abstract :
This study addresses the mechanics of the relatively brittle solder/intermetallic (IMC) interface fracture process using damage mechanics concept. The damage state, ¿ of a material point in the solder/IMC interface, is expressed in terms of orthogonal traction components in a quadratic failure criterion of a cohesive zone model. The model is then employed in a finite element analysis of a solder ball shear push test. The simulated test specimen consists of reflowed SAC405 solder-on-OSP copper pad and orthotropic FR4 substrate. Unified inelastic strain constitutive model with optimized material parameters describes the strain rate-response of the SAC405 solder. The cohesive zone model parameter values are compiled from published experimental data on SAC405 solder ball pull tests and shear push tests. The predicted shear tool force-displacement curve compared well with published experimental data. The normal-to-shear traction ratio at the onset of interface fracture is 1.59 indicating significant induced bending effect due to shear tool clearance. Rapid interface crack propagation is predicted following the initiation of crack with the average crack speed up to 24.6 times the applied shear tool speed at 3000 mm/sec. The progressive boundary between damaged (¿<1.0) and fractured (¿=1.0) interface is interpreted as the interface crack front. The high stress concentration along the edge of the solder/IMC interface facilitates local crack initiation and dictates the shape of the dynamic crack front.
Keywords :
cracks; failure analysis; finite element analysis; fracture mechanics; integrated circuit interconnections; materials testing; solders; Pb-free solder interconnects; ball pull tests; cohesive zone model parameter values; damage mechanics; damage state; dynamic crack front; finite element analysis; high stress concentration; induced bending effect; interface crack front; local crack initiation; material point; normal-to-shear traction ratio; optimized material parameters; orthogonal traction components; orthotropic FR4 substrate; quadratic failure criterion; rapid interface crack propagation; reflowed SAC405 solder-on-OSP copper pad; relatively brittle solder/intermetallic interface fracture process; shear push tests; shear tool clearance; shear tool force-displacement curve; solder ball shear push test; solder/IMC interface; strain rate-response; unified inelastic strain constitutive model; Capacitive sensors; Equations; Lead; Packaging; Plastics; Predictive models; Soldering; Solid modeling; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5099-2
Electronic_ISBN :
978-1-4244-5100-5
Type :
conf
DOI :
10.1109/EPTC.2009.5416455
Filename :
5416455
Link To Document :
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