Title :
Analysis of power/ground noise effect on performance degradation of analog-to-digital converter
Author :
Ahn, Woojin ; Shim, Jongjoo ; Cho, Jeonghyeon ; Shin, Minchul ; Koo, Kyoungchoul ; Kim, Joungho
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., KAIST (Korea Adv. Inst. of Sci. & Technol.), Daejeon, South Korea
Abstract :
This paper presents the analysis of the effect of power/ground noise on analog-to-digital converter (ADC). Power/ground noise is one of the noise sources to degrade ADC performance. Power distribution networks of off-chip and on-chip are modeled to analyze the mount of noise coupling and frequency response. Also, power/ground noise effect on ADC circuit is analyzed by spice simulation. It is analyzed and simulated that how noise coupled on power and ground can degrade designed flash ADC performance.
Keywords :
SPICE; analogue-digital conversion; frequency response; power electronics; SPICE simulation; analog-to-digital converter; frequency response; noise coupling; performance degradation; power distribution networks; power/ground noise effect; Analog-digital conversion; Analytical models; Circuit noise; Circuit simulation; Coupling circuits; Degradation; Frequency response; Network-on-a-chip; Performance analysis; Power systems;
Conference_Titel :
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5099-2
Electronic_ISBN :
978-1-4244-5100-5
DOI :
10.1109/EPTC.2009.5416463
