• DocumentCode
    3519982
  • Title

    Quadratic-chi similarity metric learning for histogram feature

  • Author

    Cai, Xinyuan ; Xiao, Baihua ; Wang, Chunheng ; Zhang, Rongguo

  • Author_Institution
    State Key Lab. of Intell. Control & Manage. of Complex Syst., Inst. of Autom., Beijing, China
  • fYear
    2011
  • fDate
    28-28 Nov. 2011
  • Firstpage
    47
  • Lastpage
    51
  • Abstract
    Histogram features, such as SIFT, HOG, LBP et al, are widely used in modern computer vision algorithms. According to [18], chi-square distance is an effective measure for comparing histogram features. In this paper, we propose a new method, named the Quadric-chi similarity metric learning (QCSML) for histogram features. The main contribution of this paper is that we propose a new metric learning method based on chi-square distance, in contrast with traditional Mahalanobis distance metric learning methods. The use of quadric-chi similarity in our method leads to an effective learning algorithm. Our method is tested on SIFT features for face identification, and compared with the state-of-art metric learning method (LDML) on the benchmark dataset, the Labeled Faces in the Wild (LFW). Experimental results show that our method can achieve clear performance gains over LDML.
  • Keywords
    computer vision; face recognition; feature extraction; learning (artificial intelligence); statistical analysis; HOG feature; LBP feature; LFW dataset; Mahalanobis distance metric; SIFT feature; chi-square distance; computer vision algorithm; face identification; histogram feature; histogram of gradients; labeled faces in the wild; local binary pattern; metric learning method; quadratic-chi similarity metric learning; scale-invariant feature transform; Euclidean distance; Face; Histograms; Learning systems; Training; Vectors; Quardic-chi similarity; face identification; histogram feature; metric learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ACPR), 2011 First Asian Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4577-0122-1
  • Type

    conf

  • DOI
    10.1109/ACPR.2011.6166698
  • Filename
    6166698