• DocumentCode
    3519989
  • Title

    Automation and yield of micron-scale self-assembly processes

  • Author

    Saeedi, Ehsan ; Kim, Samuel S. ; Etzkorn, James R. ; Meldrum, Dierdre R. ; Parviz, Babak A.

  • Author_Institution
    Washington Univ., Seattle
  • fYear
    2007
  • fDate
    22-25 Sept. 2007
  • Firstpage
    375
  • Lastpage
    380
  • Abstract
    We present the use of self-assembly to integrate a large number of free-standing microcomponents onto unconventional substrates. The microcomponents are batch fabricated separately from different semiconductor materials in potentially incompatible microfabrication processes and integrated onto unconventional substrates such as glass and plastic. These substrates offer a number of unique attributes as compared with silicon such as transparency, flexibility, and lower cost. Here, we provide an overview of the self-assembly process, describe how microcomponents that can participate in the self-assembly process can be mass-produced, and discuss initial self-assembly experimental results. Our results indicate that even with a very simple set-up, self-assembly yields as high as 97% for components as small as 100 mum are achievable, making the self-assembly technique immediately comparable with (or better than) the state-of-the-art robotic pick-and-place systems. We discuss various parameters that affect the yield of the self-assembly process and a possible automation scheme.
  • Keywords
    batch processing (industrial); mass production; micromechanical devices; robotic assembly; semiconductor materials; batch fabrication; mass production; microcomponent; microfabrication process; micron-scale self-assembly process; semiconductor material; state-of-the-art robotic pick-and-place system; unconventional substrate; Costs; Glass; Microstructure; Plastics; Robotic assembly; Robotics and automation; Self-assembly; Silicon; Substrates; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation Science and Engineering, 2007. CASE 2007. IEEE International Conference on
  • Conference_Location
    Scottsdale, AZ
  • Print_ISBN
    978-1-4244-1154-2
  • Electronic_ISBN
    978-1-4244-1154-2
  • Type

    conf

  • DOI
    10.1109/COASE.2007.4341776
  • Filename
    4341776