• DocumentCode
    352006
  • Title

    Using wavelet analysis to determine the influence of northern hemisphere teleconnection patterns on sea ice concentrations in the Odden ice peninsula, Greenland Sea

  • Author

    Chasmer, Laura E. ; LeDrew, Ellsworth F. ; Sharp, Martin

  • Author_Institution
    Waterloo Lab. for Earth Obs., Waterloo Univ., Ont., Canada
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1337
  • Abstract
    The Odden sea ice peninsula undergoes rapid transformations on a day to day basis, often caused by the influence of strong synoptic weather and larger scale atmospheric teleconnection patterns. By using a Daubechies order 5 level 5 wavelet decomposition on leading modes of the North Atlantic Oscillation (NAO) teleconnection pattern and component loadings derived from a principal components analysis of sea ice concentrations, the authors have found that extended positive modes of the approximated NAO signal lead to a decline of the Odden in many cases. A sharp decline in the Odden sea ice concentration and extent is noticed within two days to one week of an increase in the NAO with ice concentrations diminishing completely after a period of approximately one month of a positive leading mode in the NAO. Comparison of the approximated signals for both the NAO and the Odden ice concentrations and extent are well correlated
  • Keywords
    oceanographic regions; sea ice; Arctic Ocean; Daubechies order 5 level 5 wavelet decomposition; Greenland Sea; NAO; North Atlantic Oscillation; Odden ice peninsula; air sea interaction; atmosphere; meteorology; northern hemisphere; rapid change; rapid transformation; sea ice; spatial distribution; spatial extent; synoptic weather; teleconnection pattern; wavelet analysis; Atmospheric waves; Brightness temperature; Geography; Geoscience; Laboratories; Pattern analysis; Principal component analysis; Sea ice; Sea measurements; Wavelet analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-6359-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.2000.858111
  • Filename
    858111