• DocumentCode
    3520132
  • Title

    Feasibility study of nanofluid cooling techniques for microelectronic systems

  • Author

    Zhang, Hengyun ; Tay, Andrew A O ; Xue, Zhengjun

  • Author_Institution
    AMD Singapore Pte Ltd., Singapore, Singapore
  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    619
  • Lastpage
    625
  • Abstract
    There has been an increasing interest of using nanoparticle dispersed fluids, or nanofluids, for heat transfer enhancements. In this study, the feasibility of nanofluid cooling technique for microelectronic systems is examined. Three major types of nanofluids dispersed with Al2O3, SiC and CuO of different volume fractions were prepared through a two-step process. The thermal conductivities of the nanofluid were measured based on the steady-state parallel plate method. Thermal conductivity enhancements were identified of 3-12% for SiC and CuO nanofluids and 3-8% for Al2O3 nanofluids. Moreover, the nanofluids cooling performance was tested in a liquid cooling jig for both single channel heat sink (SCHS) and microchannel heat sink (MCHS) on a thermal test die. It was found that there was almost no thermal enhancement for single channel heat sink with the Al2O3 and SiC nanofluids. On the other hand, a maximum reduction of 11% in thermal enhancement was obtained for microchannel heat sink (MCHS), at the expense of a much higher pressure drop. Clogging issues associated with the nanofluid cooling are also discussed.
  • Keywords
    aluminium compounds; cooling; copper compounds; integrated circuit packaging; microchannel flow; nanofluidics; silicon compounds; thermal conductivity; Al2O3; CuO; SiC; heat transfer enhancement; liquid cooling jig; microchannel heat sink; microelectronic systems; nanofluid cooling technique; nanoparticle dispersed fluid; single channel heat sink; steady state parallel plate method; thermal conductivity; Conductivity measurement; Cooling; Heat sinks; Heat transfer; Microchannel; Microelectronics; Silicon carbide; Steady-state; Testing; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-5099-2
  • Electronic_ISBN
    978-1-4244-5100-5
  • Type

    conf

  • DOI
    10.1109/EPTC.2009.5416474
  • Filename
    5416474