DocumentCode :
3520154
Title :
Studies on microstructure and mechanical properties of Sn-Zn-Bi-Cr lead-free solder
Author :
Luo, Tingbi ; Hu, Anmin ; Li, Ming ; Mao, Dali
Author_Institution :
Lab. of Microelectron. Mater. & Technol., Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2009
fDate :
10-13 Aug. 2009
Firstpage :
815
Lastpage :
818
Abstract :
In this paper, Traces of Cr were added into Sn-8Zn-3Bi solder alloys to study the influences of Cr on mechanical properties and high temperature reliability of solder alloys by room temperature tensile test and high-temperature aging treatment. With observation of microstructure and fracture surface analysis, the strengthening mechanisms of Cr in solder alloys were discussed. Experiments show that: the microstructure was refined after traces of Cr added and two kinds of intermetallic compound (IMC) formed. Therefore the addition of Cr improved the plasticity of Sn-8Zn-3Bi alloy. The elongation reached up to 50.96% after 0.1% Cr added; and the fracture mechanism converted from quasi-cleavage fracture into ductile fracture. But after more than 0.3% Cr added, the brittleness of the alloy increased. During 0, 4, 9, 16 days aging, the mechanical properties of Sn-8Zn-3Bi-0.3Cr alloy were improving slightly with aging time. Through the microstructure analysis it was found that the Sn-Zn-Cr phase was transited after aging and Zn in alloy was consumed, so that primary Zn phase was reduced and microstructure was improved.
Keywords :
bismuth; chromium; crystal microstructure; ductile fracture; fracture mechanics; plasticity; solders; tin; zinc; Sn-Zn-Bi-Cr; ductile fracture; elongation; fracture mechanism; fracture surface analysis; high temperature reliability; high-temperature aging treatment; intermetallic compound; lead-free solder; mechanical properties; microstructure; plasticity; quasi-cleavage fracture; room temperature; solder alloys; strengthening mechanisms; tensile test; Aging; Chromium alloys; Environmentally friendly manufacturing techniques; Lead; Mechanical factors; Microstructure; Surface cracks; Temperature; Testing; Zinc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4658-2
Electronic_ISBN :
978-1-4244-4659-9
Type :
conf
DOI :
10.1109/ICEPT.2009.5270636
Filename :
5270636
Link To Document :
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