• DocumentCode
    352017
  • Title

    C1-approximation of seafloor surfaces with large variations

  • Author

    Gout, Christian ; Komatitsch, Dimitri

  • Author_Institution
    Dept. of Appl. Math., Pau Univ., France
  • Volume
    5
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1836
  • Abstract
    In many problems of geophysical interest, when trying to describe surfaces, one has to deal with data that exhibit rapid variations. This occurs for instance when describing the topography of mountain ranges, volcanoes, seafloor surfaces (bathymetry maps), islands, or the shape of geological entities, that can present large and rapid variations due for instance to the presence of faults in the structure. The correct description of such geological surfaces, by a fitting process from a given set of points, is therefore of great importance. Usual methods give good results in the case of curve fitting, but less accurate results in the case of surface fitting. The new method the authors propose uses scale transformations (spline under tension), and is applied without any particular a priori knowledge of the data. They first propose a construction of these scale transformations families, and then show the efficiency of this innovative approach by applying it to seafloor surfaces around the Big Island in Hawaii in order to get a regular surface with at least continuity of the first derivatives
  • Keywords
    bathymetry; geophysical signal processing; seafloor phenomena; splines (mathematics); surface fitting; C1-approximation topography; bathymetry; data analysis; fitting process; large variation; oceanic crust; rapid variation; scale transformation; seafloor; seafloor surface; spline; surface fitting; Convergence; Interpolation; Lagrangian functions; Linear systems; Oceanographic techniques; Oceans; Sea surface; Smoothing methods; Spline; Surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-6359-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.2000.858139
  • Filename
    858139