Title :
Compatibility of Queueing Theory, Manufacturing Systems and SEMI Standards
Author :
Wu, Kan ; McGinnis, Leon F. ; Zwart, Bert
Author_Institution :
Georgia Inst. of Technol, Atlanta
Abstract :
Queueing theory is a powerful method to evaluate the performance of a manufacturing system. However, when applying it to a real system, both practical and theoretical issues arise. The practical issues are how to determine the parameter values for queuing models from the data available in real manufacturing systems. We explore this issue by comparing the data needed by queueing models to SEMI standards definitions. The theoretical issues are the selection of a specific queuing model and its proper use. In order to illustrate this, we design a specific situation for the applications of an M/M/1/Unreliable Machine queue, and compare the performances of two other approaches with it. The results show that, depending on the approach chosen, the differences in approximation error for cycle time can be over 30% at lower utilization levels.
Keywords :
manufacturing systems; queueing theory; semiconductor device manufacture; standards; M/M/1/Unreliable Machine queue; SEMI standards; approximation error; manufacturing system; queueing theory; semiconductor manufacturing; Electric breakdown; Manufacturing automation; Manufacturing industries; Manufacturing systems; Power engineering and energy; Power system modeling; Queueing analysis; Systems engineering and theory; Terminology; USA Councils; SEMI standards; queueing theory; unreliable machine queue; utilization;
Conference_Titel :
Automation Science and Engineering, 2007. CASE 2007. IEEE International Conference on
Conference_Location :
Scottsdale, AZ
Print_ISBN :
978-1-4244-1154-2
Electronic_ISBN :
978-1-4244-1154-2
DOI :
10.1109/COASE.2007.4341792