Bulk damage threshold and three-dimensional microstructuring of dielectrics using the self-focusing of ultrashort laser pulses

Author

Ashkenasi, D. ; Rosenfeld, Avi ; Varel, H. ; Lorenz, M. ; Campbell, E.E.B.

Author_Institution

Max-Born-Inst. fur Nichtlineare Optik & Kurzzeitspektroskopie, Berlin, Germany

fYear

1998

fDate

3-8 May 1998

Firstpage

149

Lastpage

150

Abstract

Summary form only given. We present experimental results on laser induced bulk modifications for different transparent materials, depending on pulse width and energy. To induce bulk modifications we utilized the beam-narrowing effects of self focusing in a positive Kerr medium. Concerning possible applications, self-focusing of laser light in transparent materials has often been regarded as a problem to be avoided due to the destruction of optical components in high power laser systems.

Keywords

dielectric materials; high-speed optical techniques; laser beam applications; laser beam effects; optical Kerr effect; beam-narrowing effects; bulk damage threshold; bulk modifications; dielectrics; high power laser systems; laser light self focusing; optical components; positive Kerr medium; pulse energy; pulse width; self-focusing; three-dimensional microstructuring; transparent materials; ultrashort laser pulses; Dielectric materials; Gas lasers; Laser applications; Materials processing; Nonlinear optics; Optical devices; Optical materials; Optical pulses; Power lasers; Space vector pulse width modulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on

Conference_Location

San Francisco, CA, USA

Print_ISBN

1-55752-339-0

Type

conf

DOI

10.1109/CLEO.1998.675981

Filename

675981