• DocumentCode
    3520282
  • Title

    Applicability of an integrated model-based testing approach for RTES

  • Author

    Iyenghar, Padma ; Spieker, Michael ; Tecker, Pablo ; Wuebbelmann, Juergen ; Westerkamp, Clemens ; Van der Heiden, Walter ; Willert, Andreas

  • Author_Institution
    Inst. of Comput. Eng., UAS, Osnabruck, Germany
  • fYear
    2011
  • fDate
    26-29 July 2011
  • Firstpage
    871
  • Lastpage
    876
  • Abstract
    The increasing complexity and wide applicability of Real-Time Embedded Systems (RTES) necessitates use of advanced and automated development and testing methodologies to meet time-to-market constraints, quality assurance and safety standards. In this context, the applicability of Model Driven Development (MDD) and Model-Based Testing (MBT) methodologies for RTES have been gaining attention in the recent decade. MBT approaches, in general, helps in automatically generating test cases using models extracted from software artifacts. However, currently none of the existing MBT approaches deal with generating test artifacts for executing and verifying these test cases in memory size constrained and code-size critical RTES. To address this, an integrated MBT approach for executing the test stimuli in the RTES (without dynamic source code instrumentation) is discussed in this paper. A prototype implementation is discussed followed by an experimental evaluation of this approach for an RTES example. Finally, this paper presents a perspective on the applicability of model-based approach for industrial RTES projects.
  • Keywords
    embedded systems; program testing; software quality; automated development; dynamic source code instrumentation; integrated model-based testing; model driven development; quality assurance; real-time embedded systems; safety standards; software artifacts; testing methodologies; time-to-market constraints; Data models; Embedded systems; Mathematical model; Monitoring; Real time systems; Testing; Unified modeling language;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Informatics (INDIN), 2011 9th IEEE International Conference on
  • Conference_Location
    Caparica, Lisbon
  • Print_ISBN
    978-1-4577-0435-2
  • Electronic_ISBN
    978-1-4577-0433-8
  • Type

    conf

  • DOI
    10.1109/INDIN.2011.6035008
  • Filename
    6035008