DocumentCode
3520301
Title
Intermetallics formation and evolution in pure indium joint for cryogenic application
Author
Cheng, X. ; Liu, C. ; Silberschmidt, V.V.
Author_Institution
Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ., Loughborough, UK
fYear
2009
fDate
9-11 Dec. 2009
Firstpage
562
Lastpage
566
Abstract
Intermetallic compounds (IMCs) properties play a significant role in determining the reliability of solder joints in service. IMCs and their evolution become more important for devices with micro- or nano-scale joints used in cryogenic applications. In this study, the interfacial reactions of In/Cu and In/Ni/Cu due to low-temperature cycling are investigated. The results illustrate that the character of IMCs is linked to thickness of indium joints exposed to low-temperature cycling. The formation of Cu-In IMCs and Ni-In IMCs are diffusion-controlled, and low-temperature cycling results in brittle IMCs.
Keywords
alloys; copper alloys; cryogenic electronics; indium alloys; nickel alloys; reliability; solders; In; In-Cu; In-Ni-Cu; cryogenic; interfacial reactions; intermetallic compounds; intermetallics evolution; intermetallics formation; low-temperature cycling; micro-scale joints; nano-scale joints; solder joints reliability; Assembly; Bonding; Copper; Cryogenics; Detectors; Indium; Intermetallic; Nickel; Soldering; Temperature; cryogenic application; indium joint; interfacial reaction; low-temperature cycling;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location
Singapore
Print_ISBN
978-1-4244-5099-2
Electronic_ISBN
978-1-4244-5100-5
Type
conf
DOI
10.1109/EPTC.2009.5416484
Filename
5416484
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