• DocumentCode
    3520301
  • Title

    Intermetallics formation and evolution in pure indium joint for cryogenic application

  • Author

    Cheng, X. ; Liu, C. ; Silberschmidt, V.V.

  • Author_Institution
    Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ., Loughborough, UK
  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    562
  • Lastpage
    566
  • Abstract
    Intermetallic compounds (IMCs) properties play a significant role in determining the reliability of solder joints in service. IMCs and their evolution become more important for devices with micro- or nano-scale joints used in cryogenic applications. In this study, the interfacial reactions of In/Cu and In/Ni/Cu due to low-temperature cycling are investigated. The results illustrate that the character of IMCs is linked to thickness of indium joints exposed to low-temperature cycling. The formation of Cu-In IMCs and Ni-In IMCs are diffusion-controlled, and low-temperature cycling results in brittle IMCs.
  • Keywords
    alloys; copper alloys; cryogenic electronics; indium alloys; nickel alloys; reliability; solders; In; In-Cu; In-Ni-Cu; cryogenic; interfacial reactions; intermetallic compounds; intermetallics evolution; intermetallics formation; low-temperature cycling; micro-scale joints; nano-scale joints; solder joints reliability; Assembly; Bonding; Copper; Cryogenics; Detectors; Indium; Intermetallic; Nickel; Soldering; Temperature; cryogenic application; indium joint; interfacial reaction; low-temperature cycling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-5099-2
  • Electronic_ISBN
    978-1-4244-5100-5
  • Type

    conf

  • DOI
    10.1109/EPTC.2009.5416484
  • Filename
    5416484