DocumentCode
3520451
Title
Low K CMOS90 2N gold wire bonding process development
Author
Han, Ming-Chuan ; Yan, Bei-Yue
Author_Institution
Freescale Semicond. (China), Ltd., Tianjin, China
fYear
2009
fDate
10-13 Aug. 2009
Firstpage
737
Lastpage
741
Abstract
The electronics industry is mainly driven by the demand for smaller, faster, higher complexity, more reliable and cheaper device. Reduction in bond pad patch and low K wafer were introduced into mass production for miniaturation and signal transmission integrity. High safety requirement and longer working life demand high reliability performance especially in automotive and aerospace filed. Although trends in electronic packing have been focused on the development of flip chip, Wire bonding still cements its position in chip interconnection technology. In IC assembly, gold wire is the key material in wire bonding process to connect chip to substrate. 2N gold wire with specific dopant is applied in many types of package for stringent reliability requirement field. This study will focus on 2N gold wire application in wire bonding process.
Keywords
electronics industry; gold; lead bonding; Au; electronic packing; electronics industry; low K CMOS90 2N gold wire bonding process development; mass production; Aerospace materials; Aerospace safety; Automotive engineering; Bonding processes; Electronics industry; Flip chip; Gold; Mass production; Wafer bonding; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-4658-2
Electronic_ISBN
978-1-4244-4659-9
Type
conf
DOI
10.1109/ICEPT.2009.5270652
Filename
5270652
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