DocumentCode :
3520515
Title :
TEM interfacial characteristics of thermosonic gold wire bonding on aluminium metallization
Author :
Xu, Hao ; Liu, Cong ; Silberschmidt, Vadim V. ; Chen, Zhe ; Sivakumar, M.
Author_Institution :
Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ., Loughborough, UK
fYear :
2009
fDate :
9-11 Dec. 2009
Firstpage :
512
Lastpage :
517
Abstract :
A native alumina thin film existing on aluminium and its evolution in thermosonic gold wire bonding were characterized using high resolution transmission electron microscopy (HR TEM). It has been found that the partly fracture of this alumina film by the ultrasonic vibration allows the interdiffusion at the Au/Al interface, such that the intermetallic compounds (IMCs) are formed. The IMCs are identified as Au4Al and AuAl2 with a thickness of approximately 300 nm. With a higher ultrasonic energy, IMCs are formed in more contact areas, resulting in a stronger bond. Based on these experimental results, a mechanism of ultrasonic gold wire bonding is proposed, which helps to understand the correlation among ultrasonic energy, interfacial structure and bonding strength.
Keywords :
aluminium alloys; gold alloys; integrated circuit interconnections; integrated circuit metallisation; lead bonding; transmission electron microscopy; Al2O3; Au-Al; TEM interfacial characteristic; bonding strength; interfacial structure; intermetallic compound; thermosonic wire bonding; transmission electron microscopy; ultrasonic energy; Aluminum oxide; Bonding; Gold; Heating; Materials science and technology; Metallization; Transistors; Transmission electron microscopy; Trigeneration; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5099-2
Electronic_ISBN :
978-1-4244-5100-5
Type :
conf
DOI :
10.1109/EPTC.2009.5416495
Filename :
5416495
Link To Document :
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