DocumentCode
3520527
Title
The influence of silicon content on the thermal conductivity of Al-Si/diamond composites
Author
Zhang, Yang ; Wang, Xitao ; Wu, Jianhua
Author_Institution
State Key Lab. for Adv. Metals & Mater., Univ. of Sci. & Technol. Beijing, Beijing, China
fYear
2009
fDate
10-13 Aug. 2009
Firstpage
708
Lastpage
712
Abstract
Diamond reinforced Al-based composites with excellent comprehensive properties (i.e., high thermal conductivity, flexible coefficient of thermal expansion) are showing great potential for high power density packaging. In this study, effect of the Silicon addition on the thermal conductivity and interfacial characteristic of the Al-Si/diamond composites are investigated. Al-Si alloy containing 1.0, 2.0, 3.0, 4.5, 7.0, 10.0, 14.0, 20.0 wt. % Si are prepared as the matrix and Al-Si/diamond composites are fabricated by pressure infiltration under 800degC and 5 Mpa. The analysis of the SEM and the element distribution maps detected by the EDX shows that, as the Si addition, the Si skeleton of the AlSi-eutectic phase segregates to the diamond particle surface and form a better bonding between the reinforcement phase and the matrix. The highest thermal conductivity of the composites gets at Al-1.0 Si/diamond as 248 W/m K. The results, which are calculated using the differential effective medium scheme (DEM), indicate that the interfacial thermal conductance (h) shows first an increase and then a decrease with Silicon content. Overall, Si addition can raise the h.
Keywords
aluminium; composite materials; diamond; elemental semiconductors; eutectic structure; interface structure; scanning electron microscopy; silicon; thermal conductivity; Al-Si-C; AlSi-eutectic phase; aluminium-silicon-diamond composites; diamond particle surface; differential effective medium scheme; element distribution maps; interfacial characteristic; pressure infiltration; scanning electron microscopy; silicon addition; silicon content; thermal conductivity; Conducting materials; Crystalline materials; Electronic packaging thermal management; Powders; Scanning electron microscopy; Silicon; Thermal conductivity; Thermal expansion; Thermal management; Thermal management of electronics;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-4658-2
Electronic_ISBN
978-1-4244-4659-9
Type
conf
DOI
10.1109/ICEPT.2009.5270658
Filename
5270658
Link To Document