• DocumentCode
    3520527
  • Title

    The influence of silicon content on the thermal conductivity of Al-Si/diamond composites

  • Author

    Zhang, Yang ; Wang, Xitao ; Wu, Jianhua

  • Author_Institution
    State Key Lab. for Adv. Metals & Mater., Univ. of Sci. & Technol. Beijing, Beijing, China
  • fYear
    2009
  • fDate
    10-13 Aug. 2009
  • Firstpage
    708
  • Lastpage
    712
  • Abstract
    Diamond reinforced Al-based composites with excellent comprehensive properties (i.e., high thermal conductivity, flexible coefficient of thermal expansion) are showing great potential for high power density packaging. In this study, effect of the Silicon addition on the thermal conductivity and interfacial characteristic of the Al-Si/diamond composites are investigated. Al-Si alloy containing 1.0, 2.0, 3.0, 4.5, 7.0, 10.0, 14.0, 20.0 wt. % Si are prepared as the matrix and Al-Si/diamond composites are fabricated by pressure infiltration under 800degC and 5 Mpa. The analysis of the SEM and the element distribution maps detected by the EDX shows that, as the Si addition, the Si skeleton of the AlSi-eutectic phase segregates to the diamond particle surface and form a better bonding between the reinforcement phase and the matrix. The highest thermal conductivity of the composites gets at Al-1.0 Si/diamond as 248 W/m K. The results, which are calculated using the differential effective medium scheme (DEM), indicate that the interfacial thermal conductance (h) shows first an increase and then a decrease with Silicon content. Overall, Si addition can raise the h.
  • Keywords
    aluminium; composite materials; diamond; elemental semiconductors; eutectic structure; interface structure; scanning electron microscopy; silicon; thermal conductivity; Al-Si-C; AlSi-eutectic phase; aluminium-silicon-diamond composites; diamond particle surface; differential effective medium scheme; element distribution maps; interfacial characteristic; pressure infiltration; scanning electron microscopy; silicon addition; silicon content; thermal conductivity; Conducting materials; Crystalline materials; Electronic packaging thermal management; Powders; Scanning electron microscopy; Silicon; Thermal conductivity; Thermal expansion; Thermal management; Thermal management of electronics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4658-2
  • Electronic_ISBN
    978-1-4244-4659-9
  • Type

    conf

  • DOI
    10.1109/ICEPT.2009.5270658
  • Filename
    5270658