DocumentCode
3520528
Title
Digital impulse measurements meeting standards while pushing the limits
Author
McComb, T.R. ; Dunn, J. ; Kuffel, J.
Author_Institution
Nat. Res. Council of Canada, Ottawa, Ont., Canada
Volume
1
fYear
1999
fDate
1999
Firstpage
21
Abstract
A brief outline of changes in recent versions of standards for digital voltage impulse measurements has been given. The authors support the use of the actual resolution in setting limits on the performance of digitizers. Measurements are presented that show how enhanced resolution based on oversampling can be used to give high accuracy in measurements. The authors propose that it is time to extend the standards to cover such features so that their use can be accepted in contractual tests that are covered by the standards
Keywords
digital instrumentation; IEEE Standard 1122:1998; digital impulse measurements; digitizers; direct voltage calibration; enhanced resolution; oversampling; standards; voltage impulse measurements;
fLanguage
English
Publisher
iet
Conference_Titel
High Voltage Engineering, 1999. Eleventh International Symposium on (Conf. Publ. No. 467)
Conference_Location
London
ISSN
0537-9989
Print_ISBN
0-85296-719-5
Type
conf
DOI
10.1049/cp:19990498
Filename
820166
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