• DocumentCode
    3520528
  • Title

    Digital impulse measurements meeting standards while pushing the limits

  • Author

    McComb, T.R. ; Dunn, J. ; Kuffel, J.

  • Author_Institution
    Nat. Res. Council of Canada, Ottawa, Ont., Canada
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    21
  • Abstract
    A brief outline of changes in recent versions of standards for digital voltage impulse measurements has been given. The authors support the use of the actual resolution in setting limits on the performance of digitizers. Measurements are presented that show how enhanced resolution based on oversampling can be used to give high accuracy in measurements. The authors propose that it is time to extend the standards to cover such features so that their use can be accepted in contractual tests that are covered by the standards
  • Keywords
    digital instrumentation; IEEE Standard 1122:1998; digital impulse measurements; digitizers; direct voltage calibration; enhanced resolution; oversampling; standards; voltage impulse measurements;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    High Voltage Engineering, 1999. Eleventh International Symposium on (Conf. Publ. No. 467)
  • Conference_Location
    London
  • ISSN
    0537-9989
  • Print_ISBN
    0-85296-719-5
  • Type

    conf

  • DOI
    10.1049/cp:19990498
  • Filename
    820166