Title :
Digital impulse measurements meeting standards while pushing the limits
Author :
McComb, T.R. ; Dunn, J. ; Kuffel, J.
Author_Institution :
Nat. Res. Council of Canada, Ottawa, Ont., Canada
Abstract :
A brief outline of changes in recent versions of standards for digital voltage impulse measurements has been given. The authors support the use of the actual resolution in setting limits on the performance of digitizers. Measurements are presented that show how enhanced resolution based on oversampling can be used to give high accuracy in measurements. The authors propose that it is time to extend the standards to cover such features so that their use can be accepted in contractual tests that are covered by the standards
Keywords :
digital instrumentation; IEEE Standard 1122:1998; digital impulse measurements; digitizers; direct voltage calibration; enhanced resolution; oversampling; standards; voltage impulse measurements;
Conference_Titel :
High Voltage Engineering, 1999. Eleventh International Symposium on (Conf. Publ. No. 467)
Conference_Location :
London
Print_ISBN :
0-85296-719-5
DOI :
10.1049/cp:19990498