DocumentCode :
3520629
Title :
Liquid-state interfacial reactions between Sn-Ag-Cu-Fe composite solders and Cu substrate
Author :
Liu, Xiaoying ; Zhao, Yanhui ; Huang, Mingliang ; Wu, C.M.L. ; Wang, Lai
Author_Institution :
Dept. of Mater. Eng., Dalian Univ. of Technol., Dalian, China
fYear :
2009
fDate :
10-13 Aug. 2009
Firstpage :
687
Lastpage :
690
Abstract :
Growth kinetics and interfacial morphologies of the intermetallic compound (IMCs) between Sn-3Ag-0.5Cu-xFe(0, 0.5wt.%, 1wt.%) composite solders and Cu substrates were investigated by reflowing for different durations at 250degC. Fe particles were deposited quickly in the vicinity of IMCs of the as-reflow samples due to the higher density of Fe than that of Sn-Ag-Cu. They formed a region about 30mum wide where the volume percentage of Fe particles could reach 19%. The isothermal equation of chemical reaction and phase diagrams is used to explain the effect of Fe on the growth kinetics of IMCs under liquid-state conditions. It is found that Fe can effectively retard the growth of Cu6Sn5 and Cu3Sn during liquid-state aging and reduce the size of Cu6Sn5 particles. Some local small cracks were observed in the Cu6Sn5 particles near interfaces of SAC solder alloys after reflowing for about five minutes. Such cracks were found in the other composite solders only thirty minutes reflow.
Keywords :
chemical reactions; composite materials; copper; copper alloys; cracks; interface phenomena; iron alloys; phase diagrams; silver alloys; solders; surface chemistry; tin alloys; Cu; Cu substrate; Fe particle; Sn-Ag-Cu-Fe-Cu; chemical reaction; composite solders; cracks; growth kinetics; interfacial morphology; isothermal equation; liquid state aging; liquid-state interfacial reactions; phase diagram; temperature 250 degC; Aging; Chemicals; Copper alloys; Equations; Intermetallic; Iron; Isothermal processes; Kinetic theory; Morphology; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4658-2
Electronic_ISBN :
978-1-4244-4659-9
Type :
conf
DOI :
10.1109/ICEPT.2009.5270662
Filename :
5270662
Link To Document :
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