DocumentCode :
3520732
Title :
Queue time and x-factor characteristics for semiconductor manufacturing with small lot sizes
Author :
Schmidt, Kilian ; Rose, Oliver
Author_Institution :
AMD Saxony LLC & Co. KG, Dresden
fYear :
2007
fDate :
22-25 Sept. 2007
Firstpage :
1069
Lastpage :
1074
Abstract :
Small lot size is widely regarded as a promising means to achieve shorter cycle times in semiconductor manufacturing. The dominant contributor to cycle time is queue time. In this paper, we quantify how the queue time changes with lot size reductions by means of queuing theory and single-operation simulation. This includes an analysis of the factors shaping this queue time change and how their influence changes for different availability characteristics. Additionally, the x-factor changes resulting from the changes in queue time and raw process time are outlined.
Keywords :
lot sizing; queueing theory; semiconductor device manufacture; lot size reduction; queue time; queuing theory; semiconductor manufacturing; single-operation simulation; x-factor characteristics; Analytical models; Availability; Delay effects; Manufacturing automation; Manufacturing processes; Queueing analysis; Semiconductor device manufacture; Semiconductor materials; Solid modeling; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation Science and Engineering, 2007. CASE 2007. IEEE International Conference on
Conference_Location :
Scottsdale, AZ
Print_ISBN :
978-1-4244-1154-2
Electronic_ISBN :
978-1-4244-1154-2
Type :
conf
DOI :
10.1109/COASE.2007.4341825
Filename :
4341825
Link To Document :
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