• DocumentCode
    35210
  • Title

    Simulating Silicon Photomultiplier Response to Scintillation Light

  • Author

    Jha, Alok K. ; van Dam, H.T. ; Kupinski, Matthew A. ; Clarkson, Eric

  • Author_Institution
    Coll. of Opt. Sci., Univ. of Arizona, Tucson, AZ, USA
  • Volume
    60
  • Issue
    1
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    336
  • Lastpage
    351
  • Abstract
    The response of a Silicon Photomultiplier (SiPM) to optical signals is affected by many factors including photon-detection efficiency, recovery time, gain, optical crosstalk, afterpulsing, dark count, and detector dead time. Many of these parameters vary with overvoltage and temperature. When used to detect scintillation light, there is a complicated non-linear relationship between the incident light and the response of the SiPM. In this paper, we propose a combined discrete-time discrete-event Monte Carlo (MC) model to simulate SiPM response to scintillation light pulses. Our MC model accounts for all relevant aspects of the SiPM response, some of which were not accounted for in the previous models. We also derive and validate analytic expressions for the single-photoelectron response of the SiPM and the voltage drop across the quenching resistance in the SiPM microcell. These analytic expressions consider the effect of all the circuit elements in the SiPM and accurately simulate the time-variation in overvoltage across the microcells of the SiPM. Consequently, our MC model is able to incorporate the variation of the different SiPM parameters with varying overvoltage. The MC model is compared with measurements on SiPM-based scintillation detectors and with some cases for which the response is known a priori. The model is also used to study the variation in SiPM behavior with SiPM-circuit parameter variations and to predict the response of a SiPM-based detector to various scintillators.
  • Keywords
    Monte Carlo methods; optical crosstalk; optical signal detection; overvoltage; photodetectors; photomultipliers; radiation quenching; scintillation; silicon radiation detectors; solid scintillation detectors; SiPM behavior; SiPM microcell; SiPM-based scintillation detectors; SiPM-circuit parameter variations; afterpulsing; circuit elements; dark count; detector dead time; discrete-time discrete-event Monte Carlo model; incident light; optical crosstalk; optical signals; overvoltage; photon-detection efficiency; quenching resistance; recovery time; scintillation light pulses; silicon photomultiplier response; single-photoelectron response; time-variation; voltage drop; Detectors; Integrated circuit modeling; Microcell networks; Optical crosstalk; Photonics; Resistance; Voltage control; Circuit transient analysis; Monte Carlo model; electrical characteristics; silicon photomultiplier; single-photoelectron response;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2012.2234135
  • Filename
    6423840