Title :
A novel non-photolithographic patterning method for fabricating solar cells
Author :
Saha, S. ; Rao, R.A. ; Mathew, L. ; Ainom, M. ; Banerjee, S.K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas, Austin, TX, USA
Abstract :
In this work we propose and demonstrate a novel method to fabricate semiconductor devices using a shadow mask that allows selective deposition of PECVD layers and selective exposure of doped silicon regions. The exposed regions then act as seed layers for selective metallization by a process such as electroplating. A device structure taking advantage of this process can be completely done without any photolithographic steps. In semiconductor processes where submicron-feature sizes are generally not required and reducing cost of manufacturing is key (e.g. in solar cells), this proposed process flow could be really useful. We have fabricated a conventional diffused p-n junction monofacial solar cell on a monocrystalline silicon (c-Si) substrate using this method. Nickel is electrochemically grown to form front surface electrode. The monofacial solar cell fabricated with an un-optimized process shows an efficiency of 14.5% under AM1.5G one sun illumination. The feature size of metal electrodes formed in this way is 80μm and could be narrowed down to smaller size-width. Optimization of doping, surface passivation and metallization would improve the efficiency even further to values in the high teens by improving open circuit voltage (VOC), current density (JSC) and Fill Factor (FF).
Keywords :
elemental semiconductors; plasma CVD; silicon; solar cells; AM1.5G one sun illumination; PECVD layers; Si; current density; device structure; diffused p-n junction monofacial solar cell; doping; efficiency 14.5 percent; fill factor; front surface electrode; metal electrodes; monocrystalline silicon substrate; nonphotolithographic patterning method; open circuit voltage; selective deposition; selective metallization; semiconductor devices; shadow mask; solar cells fabrication; surface passivation; Metallization; Nickel; Photovoltaic cells; Semiconductor device measurement; Silicon; Surface treatment; electroplating; front surface metallization; non-photolithographic process; silicon nitride;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-0064-3
DOI :
10.1109/PVSC.2012.6318045