• DocumentCode
    3521021
  • Title

    Fully analytic compact model of ballistic gate-all-around MOSFET with rectangular cross section

  • Author

    Numata, Tatsuhiro ; Uno, Shigeyasu ; Kamakura, Yoshinari ; Mori, Nobuya ; Nakazato, Kazuo

  • Author_Institution
    Dept. of Electr. & Comput. Sci., Nagoya Univ., Nagoya, Japan
  • fYear
    2011
  • fDate
    8-10 Sept. 2011
  • Firstpage
    39
  • Lastpage
    42
  • Abstract
    We develop a fully analytic compact model of gate-all-around metal-oxide-semiconductor field-effect transistors in the ballistic transport. The potential shape in the wire cross section is approximated by a parabolic function. With the model potential, electron energy levels are derived analytically and have an unknown parameter. The electron energy levels are determined by solving approximately the coupled equation of charge densities derived from quantum mechanics and electrostatics. We solve the coupled equation with the Aymerich approximation technique. The unknown parameter and also electron energy levels can be derived analytically. Device characteristics calculated from the analytic model are compared with the model with the unknown parameter obtained numerically, demonstrating an excellent accuracy. We carry out a circuit simulation with the analytic model of ballistic gate-all-around metal-oxide-semiconductor field-effect transistors.
  • Keywords
    MOSFET; approximation theory; ballistic transport; electrostatics; semiconductor device models; Aymerich approximation technique; ballistic gate-all-around MOSFET; ballistic gate-all-around metal-oxide-semiconductor field-effect transistors; ballistic transport; charge density equation; circuit simulation; electron energy levels; electrostatics; fully analytic compact model; parabolic function; quantum mechanics; rectangular cross section; Analytical models; Energy states; Integrated circuit modeling; Logic gates; Mathematical model; Numerical models; Wires; GAA-MOSFETs; analytic model; ballistic transport; circuit simulation; perturbation theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2011 International Conference on
  • Conference_Location
    Osaka
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-61284-419-0
  • Type

    conf

  • DOI
    10.1109/SISPAD.2011.6035044
  • Filename
    6035044