Title :
Restructuring of the flash A/D converter to improve SEU rad tolerance
Author :
Monnier, T. ; Roche, F.M. ; Corbière, F.
Author_Institution :
Lab. d´´Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
Abstract :
The purpose of this work is to present how structural changes in the conventional Flash Analog to Digital Converter can secure it for a harsh radiation environment. The method consists in a coupling of two complementary techniques: a robust reconfiguration of the logical structure joined to a design hardening of the individual blocks. This approach preserves the ADC performances
Keywords :
analogue-digital conversion; integrated circuit modelling; integrated logic circuits; radiation hardening (electronics); ADC performance; SEU rad tolerance; design hardening; flash A/D converter; flash analog-digital converter; harsh radiation environment; logical structure; restructuring; robust reconfiguration; Analog-digital conversion; Computer errors; Coupling circuits; Digital circuits; Flip-flops; Radiation hardening; Resistors; Robots; Robustness; Voltage;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on
Conference_Location :
Fontevraud
Print_ISBN :
0-7803-5726-4
DOI :
10.1109/RADECS.1999.858607
