Title :
Nanocontrollers characterization under radiation
Author :
Bezerra, F. ; Barde, S. ; Carayon, J.L. ; Sarthou, M.
Author_Institution :
CNES, Toulouse, France
Abstract :
Within the framework of the MICROSAT and ROSETTA projects, CNES (French National Agency) has characterized the behavior of 4 nanocontrollers under heavy ions, protons and total dose. These products are frequently used in industrial and commercial applications. They have been chosen for ROSETTA (S-band transmitter/receiver and TM/TC) and MICROSAT (OBC and payload management unit) for the following reasons : easy use, numerous I/Os; 12C link, USART, timer, ADC, internal RAM and PROM; low consumption (a few mA at 5 V); and low mass and dimension (SOIC 28). The aim of this work was to determine the best candidate for MICROSAT application within the whole market offer
Keywords :
integrated circuit testing; ion beam effects; microcontrollers; proton effects; radiation effects; space vehicle electronics; 5 V; CNES; MICROSAT project; ROSETTA project; S-band transmitter/receiver; SOIC 28; heavy ions; nanocontrollers characterization; payload management unit; protons; space radiation environment; total dose; Circuit testing; Error correction; Microprocessors; PROM; Payloads; Power supplies; Protons; Random access memory; Read-write memory; Registers;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on
Conference_Location :
Fontevraud
Print_ISBN :
0-7803-5726-4
DOI :
10.1109/RADECS.1999.858653
