Title :
Combating digital noise in high speed ULSI circuits using binary BCH encoding
Author :
Pamunuwa, Dinesh ; Zheng, Li-Rong ; Tenhunen, Hannu
Author_Institution :
Dept. of Electron., R. Inst. of Technol., Stockholm, Sweden
Abstract :
Increased integration in deep submicron (DSM) technologies has caused very high increases in the RLC parasitics which affect the coupling of noise to signals propagating over interconnect. Error free transmission on-chip will no longer be guaranteed, This paper examines the issue of high speed signaling in DSM and proposes the use of particular BCH codes to improve the bit error rate in the face of noise. We conclude from our results that it is possible to achieve a considerable coding gain by choosing the code properly
Keywords :
BCH codes; ULSI; digital integrated circuits; error statistics; high-speed integrated circuits; integrated circuit noise; BCH codes; BER improvement; RLC parasitics; binary BCH encoding; bit error rate; deep submicron technologies; digital noise; high speed ULSI circuits; high speed signaling; Bit error rate; Circuit noise; Crosstalk; Delay; Encoding; Integrated circuit interconnections; RLC circuits; Signal design; Switches; Ultra large scale integration;
Conference_Titel :
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location :
Geneva
Print_ISBN :
0-7803-5482-6
DOI :
10.1109/ISCAS.2000.858676
