DocumentCode :
352144
Title :
New high performance sub-1 V circuit technique with reduced standby current and robust data holding
Author :
Yoo, Seung-Moon ; Sung-Mo Kang
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume :
4
fYear :
2000
fDate :
2000
Firstpage :
65
Abstract :
This paper describes new high performance and low power circuit technique for the sub-1 V region. Two pairs of depletion transistors are used to construct a self-reverse bias condition for the power source transistors and feedback paths from an output node. They can be fabricated without complicated process changes. New scheme shows drastical suppression of leakage currents by about three orders and safe data holding in the standby mode without sacrificing performance degradation in the active mode and reliability problems
Keywords :
CMOS digital integrated circuits; CMOS logic circuits; VLSI; circuit feedback; integrated circuit design; leakage currents; logic design; low-power electronics; 1 V; active mode; depletion transistor pairs; feedback paths; leakage current suppression; low power circuit technique; power source transistors; robust data holding; self-reverse bias condition; standby current reduction; standby mode; sub-1 V circuit technique; Degradation; Feedback circuits; Impedance; Low voltage; MOSFETs; Robustness; Substrates; Tellurium; Threshold voltage; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location :
Geneva
Print_ISBN :
0-7803-5482-6
Type :
conf
DOI :
10.1109/ISCAS.2000.858689
Filename :
858689
Link To Document :
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