DocumentCode
352167
Title
On synthetic benchmark generation methods
Author
Verplaetse, Peter ; Van Campenhout, J. ; Stroobandt, Dirk
Author_Institution
Dept. of Electron. & Inf. Syst., Ghent Univ., Belgium
Volume
4
fYear
2000
fDate
2000
Firstpage
213
Abstract
In the process of designing complex chips and systems, the use of benchmark designs is often necessary. However, the existing benchmark suites are not sufficient for the evaluation of new architectures and EDA tools; synthetic benchmark circuits are a viable alternative. In this paper, a systematic approach for the generation and evaluation of synthetic benchmark circuits is presented. A number of existing benchmark generation methods are examined using direct validation of size and topological parameters. This exposes certain features and drawbacks of the different methods
Keywords
VLSI; circuit CAD; logic CAD; logic partitioning; network topology; EDA tools; VLSI; benchmark generation methods; direct validation; synthetic benchmark generation methods; topological parameters; Benchmark testing; Circuit testing; Electronic design automation and methodology; High level synthesis; Information systems; Process design; Size control; Space technology; Table lookup; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location
Geneva
Print_ISBN
0-7803-5482-6
Type
conf
DOI
10.1109/ISCAS.2000.858726
Filename
858726
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