DocumentCode :
352167
Title :
On synthetic benchmark generation methods
Author :
Verplaetse, Peter ; Van Campenhout, J. ; Stroobandt, Dirk
Author_Institution :
Dept. of Electron. & Inf. Syst., Ghent Univ., Belgium
Volume :
4
fYear :
2000
fDate :
2000
Firstpage :
213
Abstract :
In the process of designing complex chips and systems, the use of benchmark designs is often necessary. However, the existing benchmark suites are not sufficient for the evaluation of new architectures and EDA tools; synthetic benchmark circuits are a viable alternative. In this paper, a systematic approach for the generation and evaluation of synthetic benchmark circuits is presented. A number of existing benchmark generation methods are examined using direct validation of size and topological parameters. This exposes certain features and drawbacks of the different methods
Keywords :
VLSI; circuit CAD; logic CAD; logic partitioning; network topology; EDA tools; VLSI; benchmark generation methods; direct validation; synthetic benchmark generation methods; topological parameters; Benchmark testing; Circuit testing; Electronic design automation and methodology; High level synthesis; Information systems; Process design; Size control; Space technology; Table lookup; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location :
Geneva
Print_ISBN :
0-7803-5482-6
Type :
conf
DOI :
10.1109/ISCAS.2000.858726
Filename :
858726
Link To Document :
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