• DocumentCode
    352167
  • Title

    On synthetic benchmark generation methods

  • Author

    Verplaetse, Peter ; Van Campenhout, J. ; Stroobandt, Dirk

  • Author_Institution
    Dept. of Electron. & Inf. Syst., Ghent Univ., Belgium
  • Volume
    4
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    213
  • Abstract
    In the process of designing complex chips and systems, the use of benchmark designs is often necessary. However, the existing benchmark suites are not sufficient for the evaluation of new architectures and EDA tools; synthetic benchmark circuits are a viable alternative. In this paper, a systematic approach for the generation and evaluation of synthetic benchmark circuits is presented. A number of existing benchmark generation methods are examined using direct validation of size and topological parameters. This exposes certain features and drawbacks of the different methods
  • Keywords
    VLSI; circuit CAD; logic CAD; logic partitioning; network topology; EDA tools; VLSI; benchmark generation methods; direct validation; synthetic benchmark generation methods; topological parameters; Benchmark testing; Circuit testing; Electronic design automation and methodology; High level synthesis; Information systems; Process design; Size control; Space technology; Table lookup; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
  • Conference_Location
    Geneva
  • Print_ISBN
    0-7803-5482-6
  • Type

    conf

  • DOI
    10.1109/ISCAS.2000.858726
  • Filename
    858726