• DocumentCode
    3521670
  • Title

    Statistical analysis of commercial c-Si PV module photovoltaic efficiency distribution over 10-years period

  • Author

    Kuitche, Joseph M. ; Sharma, Vivek ; Oh, Jaewon ; Pan, Rong ; TamizhMani, Govindasamy

  • Author_Institution
    Arizona State Univ., Mesa, AZ, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    PV modules are primarily rated at standard test conditions (STC), which corresponds to 1000 W/m2 irradiance, 25°C cell temperature, and AM 1.5 spectrum. This paper presents the statistical analyses of efficiency data obtained for over 300 crystalline silicon modules from various manufacturers between 1999 and 2008. Modules were tested at Arizona State University. The objective is (1) to show how the rated efficiencies compare to the measured efficiencies (of manufacturers´ supplied modules to a certification laboratory) at STC over time, and (2) to compare measured efficiencies under two other different test conditions: SOC (standard operating condition) and Low E (low irradiance). This paper presents three major findings related to: rated versus measured STC data on manufacturers´ supplied modules to a certification laboratory; performance variability over time; and statistical significance of the efficiency increase over the time period considered.
  • Keywords
    silicon; solar cells; statistical analysis; Arizona State University; PV modules; S0C; STC; Si; cell temperature; certification laboratory; commercial c-silicon PV module photovoltaic efficiency distribution; performance variability; standard operating condition; standard test conditions; statistical analysis; temperature 25 C; time 10 year; Certification; MONOS devices; Silicon; Standards; System-on-a-chip; Temperature; Testing; module efficiency; photovoltaic modules;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318085
  • Filename
    6318085