• DocumentCode
    3521758
  • Title

    High-voltage bias testing of PV modules in the hot and humid climate without inducing irreversible instantaneous degradation

  • Author

    Dhere, Neelkanth ; Kaul, Ashwani ; Schneller, Eric ; Shiradkar, Narendra

  • Author_Institution
    Florida Solar Energy Center, Cocoa, FL, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    High-voltage bias testing of PV modules is known to be useful for revealing design, material and process flaws in PV modules. It is accepted that the hot and humid climate under high-voltage bias imposes a severely harsh environment on the PV modules and enhances the possibility of degradation. Test location is, therefore, important. A test methodology is being presented here that can provide useful information for testing PV modules at high voltage in nature´s own laboratory in a relatively short time frame.
  • Keywords
    photovoltaic cells; photovoltaic power systems; PV modules; harsh environment; high-voltage bias testing; hot and humid climate; inducing irreversible instantaneous degradation; revealing design; Degradation; Glass; Humidity; Leakage current; Resistance; Testing; High-voltage bias testing; PV; c-Si; outdoor testing; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318090
  • Filename
    6318090