• DocumentCode
    352197
  • Title

    Floating-gate techniques for assessing mismatch

  • Author

    Minch, Bradley A.

  • Author_Institution
    Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
  • Volume
    4
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    385
  • Abstract
    I discuss the importance of capacitor matching in the context of using charge stored on floating-gate MOS (FGMOS) transistors to compensate for transistor mismatch in analog circuits. I describe a simple technique that only involves static measurements for assessing the relative mismatch between capacitors. I also show experimental measurements of capacitor mismatch for small capacitors fabricated in 1.2-μm and 0.35-μm double-poly it n-well CMOS process that are commonly available
  • Keywords
    CMOS analogue integrated circuits; MOSFET; capacitors; semiconductor device measurement; 0.35 micron; 1.2 micron; CMOS analog circuit; capacitor mismatch; floating-gate MOS transistor; static measurement; Analog circuits; CMOS process; Capacitance; Coupling circuits; Current measurement; Decoding; MOS capacitors; MOSFETs; Threshold voltage; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
  • Conference_Location
    Geneva
  • Print_ISBN
    0-7803-5482-6
  • Type

    conf

  • DOI
    10.1109/ISCAS.2000.858769
  • Filename
    858769