Application of the latency insertion method to circuits with blackbox macromodel representation

Author

Schutt-Ainè, Josè ; Klokotov, Dmitri ; Goh, Patrick ; Tan, Jilin ; Al-Hawari, F. ; Liu, Ping ; Dai, Wenliang

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA

fYear

2009

fDate

9-11 Dec. 2009

Firstpage

92

Lastpage

95

Abstract

In this work the latency insertion method (LIM) is applied to the treatment of blackbox networks described by their frequency-domain scattering parameters. The method allows the simulation of passive macromodels in the LIM environment. This generalization allows LIM to simulate subnetworks with frequency-dependent parameters describing phenomena such as skin effect and substrate loss. The derivation of the algorithms is presented as well as simulation results to validate the method.

Keywords

S-parameters; integrated circuit modelling; network analysis; skin effect; blackbox macromodel representation; circuit analysis; frequency-dependent parameters; frequency-domain scattering parameters; latency insertion method; passive macromodels; skin effect; substrate loss; Circuit analysis; Circuit simulation; Computational modeling; Delay; Equations; Frequency; Integrated circuit interconnections; SPICE; Scattering parameters; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics Packaging Technology Conference, 2009. EPTC '09. 11th

Conference_Location

Singapore

Print_ISBN

978-1-4244-5099-2

Electronic_ISBN

978-1-4244-5100-5

Type

conf

DOI

10.1109/EPTC.2009.5416569

Filename

5416569