• DocumentCode
    3522167
  • Title

    Improving reliability of lateral thermosonic flip-chip bonding with ACF

  • Author

    Ha, Chang-Wan ; Kim, Kyung-soo

  • Author_Institution
    Dept. of Mech. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
  • fYear
    2009
  • fDate
    9-11 Dec. 2009
  • Firstpage
    36
  • Lastpage
    39
  • Abstract
    For interconnection of liquid crystal display (LCD) driver IC, in this paper, thermosonic (TS) flip chip bonding technique which utilizes a lateral ultrasonic vibration as an additional heat source is considered. Larger amplitude of vibration produces more heat energy, which would accelerate the curing process of epoxy. In order to avoid potential problems due to large vibration amplitude such as misalignment between bump and pad, and the plastic deformation of epoxy resin, the viscoelastic characteristics of ACF epoxy are investigated. Based on experimental results, a useful guideline to determine the vibration amplitude is newly proposed. Moreover, the experimental results clearly show the relationship between curing degree and reliable amplitude range of vibration.
  • Keywords
    creep testing; curing; flip-chip devices; lead bonding; recovery-creep; resins; ultrasonic bonding; vibrations; viscoelasticity; ACF epoxy; LCD driver IC; anisotropic conductive film; creep-recovery test; curing process; epoxy resin; heat energy; heat source; lateral thermosonic flip-chip bonding reliability; lateral ultrasonic vibration; liquid crystal display driver IC interconnection; shear test; thermosonic flip chip bonding technique; vibration amplitude; viscoelastic property; Acceleration; Bonding; Curing; Elasticity; Epoxy resins; Flip chip; Guidelines; Liquid crystal displays; Plastics; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-5099-2
  • Electronic_ISBN
    978-1-4244-5100-5
  • Type

    conf

  • DOI
    10.1109/EPTC.2009.5416577
  • Filename
    5416577