DocumentCode
3522167
Title
Improving reliability of lateral thermosonic flip-chip bonding with ACF
Author
Ha, Chang-Wan ; Kim, Kyung-soo
Author_Institution
Dept. of Mech. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
fYear
2009
fDate
9-11 Dec. 2009
Firstpage
36
Lastpage
39
Abstract
For interconnection of liquid crystal display (LCD) driver IC, in this paper, thermosonic (TS) flip chip bonding technique which utilizes a lateral ultrasonic vibration as an additional heat source is considered. Larger amplitude of vibration produces more heat energy, which would accelerate the curing process of epoxy. In order to avoid potential problems due to large vibration amplitude such as misalignment between bump and pad, and the plastic deformation of epoxy resin, the viscoelastic characteristics of ACF epoxy are investigated. Based on experimental results, a useful guideline to determine the vibration amplitude is newly proposed. Moreover, the experimental results clearly show the relationship between curing degree and reliable amplitude range of vibration.
Keywords
creep testing; curing; flip-chip devices; lead bonding; recovery-creep; resins; ultrasonic bonding; vibrations; viscoelasticity; ACF epoxy; LCD driver IC; anisotropic conductive film; creep-recovery test; curing process; epoxy resin; heat energy; heat source; lateral thermosonic flip-chip bonding reliability; lateral ultrasonic vibration; liquid crystal display driver IC interconnection; shear test; thermosonic flip chip bonding technique; vibration amplitude; viscoelastic property; Acceleration; Bonding; Curing; Elasticity; Epoxy resins; Flip chip; Guidelines; Liquid crystal displays; Plastics; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location
Singapore
Print_ISBN
978-1-4244-5099-2
Electronic_ISBN
978-1-4244-5100-5
Type
conf
DOI
10.1109/EPTC.2009.5416577
Filename
5416577
Link To Document