Title :
Improving reliability of lateral thermosonic flip-chip bonding with ACF
Author :
Ha, Chang-Wan ; Kim, Kyung-soo
Author_Institution :
Dept. of Mech. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
Abstract :
For interconnection of liquid crystal display (LCD) driver IC, in this paper, thermosonic (TS) flip chip bonding technique which utilizes a lateral ultrasonic vibration as an additional heat source is considered. Larger amplitude of vibration produces more heat energy, which would accelerate the curing process of epoxy. In order to avoid potential problems due to large vibration amplitude such as misalignment between bump and pad, and the plastic deformation of epoxy resin, the viscoelastic characteristics of ACF epoxy are investigated. Based on experimental results, a useful guideline to determine the vibration amplitude is newly proposed. Moreover, the experimental results clearly show the relationship between curing degree and reliable amplitude range of vibration.
Keywords :
creep testing; curing; flip-chip devices; lead bonding; recovery-creep; resins; ultrasonic bonding; vibrations; viscoelasticity; ACF epoxy; LCD driver IC; anisotropic conductive film; creep-recovery test; curing process; epoxy resin; heat energy; heat source; lateral thermosonic flip-chip bonding reliability; lateral ultrasonic vibration; liquid crystal display driver IC interconnection; shear test; thermosonic flip chip bonding technique; vibration amplitude; viscoelastic property; Acceleration; Bonding; Curing; Elasticity; Epoxy resins; Flip chip; Guidelines; Liquid crystal displays; Plastics; Viscosity;
Conference_Titel :
Electronics Packaging Technology Conference, 2009. EPTC '09. 11th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5099-2
Electronic_ISBN :
978-1-4244-5100-5
DOI :
10.1109/EPTC.2009.5416577