DocumentCode :
3522368
Title :
Thermal numerical simulation for advanced package development
Author :
Gao, Guohua ; Wang, Honghui ; Yang, GuoJi ; Zhu, HaiQing
Author_Institution :
Nantong Fujitsu Microelectron. Co., Ltd., Nantong, China
fYear :
2009
fDate :
10-13 Aug. 2009
Firstpage :
238
Lastpage :
241
Abstract :
In recent years, NFME has been developing advanced packages such as QFN, BGA, LGA, and SiP. In the new product development stage, thermal design needs to be taken into consideration to assess its thermal reliability. So, the accurate junction temperature prediction for the package is critical to electronic packaging design. In the industry, numerical models are often utilized to predict package thermal performance. In this paper, detailed HLQFP and BGA models were created, and a series of computational studies were conducted to obtain junction temperature and thermal resistance under JEDEC standards for natural and forced air convection conditions. In order to reduce computation time, model simplification was made from package geometry to the attached PCB test board. The simulated junction temperature values can also be used to estimate the maximum power dissipation allowed for the specific package. Thermal analysis helps determine whether the package will dissipate a sufficient amount of heat, or if it is still necessary to apply an external heat sink. Validated with experimental measurements, effective simulation can greatly help optimize advanced package structure design and material selection, and minimize the working temperature of packages to meet application requirements.
Keywords :
ball grid arrays; heat sinks; integrated circuit reliability; natural convection; numerical analysis; thermal analysis; thermal management (packaging); thermal resistance; BGA model; HLQFP model; IC advanced packaging technology; electronic packaging design; forced air convection; heat sink; junction temperature; natural convection; package geometry; power dissipation; product development; thermal analysis; thermal design; thermal reliability; thermal resistance; Computational modeling; Electronic packaging thermal management; Electronics packaging; Heat sinks; Numerical models; Numerical simulation; Product development; Temperature; Thermal conductivity; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2009. ICEPT-HDP '09. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4658-2
Electronic_ISBN :
978-1-4244-4659-9
Type :
conf
DOI :
10.1109/ICEPT.2009.5270755
Filename :
5270755
Link To Document :
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