DocumentCode :
3522378
Title :
Equivalent deflection angle of textured surfaces
Author :
Nagel, James R. ; Scarpulla, Michael A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Utah, Salt Lake City, UT, USA
fYear :
2012
fDate :
3-8 June 2012
Abstract :
The concept of optical path length enhancement is a useful tool for characterizing the effects of light trapping in thin films by providing a convenient geometrical interpretation of energy absorption. However, path length calculations cannot distinguish between absorption gains due to better antireflection versus absorption gains due to actual scattering of incident rays. We therefore introduce a similar metric of equivalent deflection angle to describe the effective scattering of light by a textured surface. This new concept provides useful information about light trapping that path length alone cannot. The paper begins with the geometrical interpretation of the metric and then demonstrates the insights derived from light scattering by a simple textured surface.
Keywords :
light scattering; solar cells; sunlight; surface texture; energy absorption gain; equivalent deflection angle; geometrical interpretation; incident rays scattering; light scattering; light trapping; optical path length enhancement; simple textured surface; thin films; Absorption; Charge carrier processes; Optical surface waves; Photovoltaic cells; Scattering; Silicon; Surface texture; light trapping; photovoltaic cells; silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
Conference_Location :
Austin, TX
ISSN :
0160-8371
Print_ISBN :
978-1-4673-0064-3
Type :
conf
DOI :
10.1109/PVSC.2012.6318121
Filename :
6318121
Link To Document :
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