• DocumentCode
    3522391
  • Title

    Exfoliated thin, flexible monocrystalline germanium heterojunction solar cells

  • Author

    Onyegam, Emmanuel U. ; Sarkar, Dabraj ; Hilali, Mohamed ; Saha, Sayan ; Rao, Rajesh ; Mathew, Leo ; Jawarani, Dharmesh ; James, William ; Mantey, Jason ; Ainom, Moses ; Garcia, Ricardo ; Banerjee, Sanjay K.

  • Author_Institution
    Univ. of Texas, Austin, TX, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Abstract
    A thin, flexible monocrystalline germanium (c-Ge) heterojunction solar cell has been developed based on a cost-effective kerfless exfoliation process and remote plasma-enhanced chemical vapor deposition (RPCVD) of hydrogenated amorphous silicon (a-Si:H). The performance of the exfoliated 50μm thick and bulk 500μm Ge heterojunction cells are compared in this paper. A superior conversion efficiency of 5.28% was achieved with the 50μm exfoliated Ge cell versus 1.78% for the bulk Ge cell, in agreement with simulation results. A record fill factor of 58.1% for an a-Si:H/c-Ge heterojunction cell is obtained with the exfoliated cell. Moreover, the conversion efficiency achieved with the 50μm exfoliated cell (without intrinsic a-Si:H passivation) is comparable to the best reported in literature with bulk Ge heterojunction cells and intrinsic a-S:H passivation.
  • Keywords
    amorphous semiconductors; germanium; hydrogen; hydrogenation; passivation; plasma CVD; semiconductor growth; semiconductor heterojunctions; silicon; solar cells; Ge-Si:H; exfoliated Ge heterojunction cell; fill factor; flexible monocrystalline germanium heterojunction solar cell; hydrogenated amorphous silicon; kerfless exfoliation process; passivation; remote plasma enhanced chemical vapor deposition; size 50 mum; size 500 mum; Conductivity; Germanium; Heterojunctions; Passivation; Photovoltaic cells; Silicon; Substrates; Germanium; heterojunction; photovoltaic cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4673-0064-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2012.6318122
  • Filename
    6318122